Regier Marc, Kemper Jörn, Kaul Michael G, Feddersen Markus, Adam Gerhard, Kahl-Nieke Bärbel, Klocke Arndt
Department of Diagnostic and Interventional Radiology, University Medical Center Hamburg-Eppendorf, Hamburg, Germany.
J Orofac Orthop. 2009 Nov;70(6):485-94. doi: 10.1007/s00056-009-9923-0. Epub 2009 Dec 4.
To assess radiofrequency (RF)-induced heating of fixed orthodontic appliances during acquisition of three different sequences in magnetic resonance imaging (MRI) at 3 Tesla.
Ten commonly used fixed orthodontic appliances were investigated utilizing a phantom head and simulating the in vivo intraoral situation. A 3 Tesla MRI system (Intera, Philips Medical Systems, Best, The Netherlands) was used to acquire T1w spin-echo (T1 SE), T1w turbo spin-echo (T1 TSE) and T1w gradient-echo (T1 GRE) sequences in axial orientation. Continuous temperature measurement was performed with a dedicated four channel fluoroptic thermometry system. For each orthodontic appliance temperature probes were placed at three predefined sites in order to perform temperature measurements during MR imaging. The fourth temperature probe was fixed to the neck of the phantom head and served as the reference. Mean temperature alterations were determined for all appliances.
Temperature elevations ranged from -0.3 degrees C to 0.2 degrees C and were negligible for all orthodontic appliances investigated. There was no difference in mean temperature alteration for any of the three imaging sequences.
Based on the data of our experimental study the radiofrequency-induced heating of orthodontic brackets during high field MRI at 3 Tesla can be categorized as negligibly low. Even the clinical routine examination of the head at 3 Tesla using high-energetic pulse sequences can be applied without hesitation in patients with fixed orthodontic appliances.
评估在3特斯拉磁共振成像(MRI)采集三种不同序列时,射频(RF)对固定正畸矫治器的加热情况。
使用仿真头模拟体内口腔情况,对十种常用的固定正畸矫治器进行研究。采用一台3特斯拉MRI系统(Intera,飞利浦医疗系统公司,荷兰贝斯特)在轴向采集T1加权自旋回波(T1 SE)、T1加权快速自旋回波(T1 TSE)和T1加权梯度回波(T1 GRE)序列。使用专用的四通道荧光光纤温度测量系统进行连续温度测量。对于每种正畸矫治器,在三个预先定义的部位放置温度探头,以便在磁共振成像期间进行温度测量。第四个温度探头固定在仿真头的颈部作为参考。确定所有矫治器的平均温度变化。
温度升高范围为-0.3摄氏度至0.2摄氏度,对于所有研究的正畸矫治器来说都可忽略不计。三种成像序列中任何一种的平均温度变化均无差异。
根据我们实验研究的数据,在3特斯拉高场MRI期间,射频对正畸托槽的加热可归类为极低,甚至在使用高能脉冲序列对佩戴固定正畸矫治器的患者进行3特斯拉头部临床常规检查时也可毫不犹豫地应用。