Shibata Naoya, Kohno Yuji, Findlay Scott D, Sawada Hidetaka, Kondo Yukihito, Ikuhara Yuichi
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan.
J Electron Microsc (Tokyo). 2010;59(6):473-9. doi: 10.1093/jmicro/dfq014. Epub 2010 Apr 19.
A new area detector for atomic-resolution scanning transmission electron microscopy (STEM) is developed and tested. The circular detector is divided into 16 segments which are individually optically coupled with photomultiplier tubes. Thus, 16 atomic-resolution STEM images which are sensitive to the spatial distribution of scattered electrons on the detector plane can be simultaneously obtained. This new detector can be potentially used not only for the simultaneous formation of common bright-field, low-angle annular dark-field and high-angle annular dark-field images, but also for the quantification of images by detecting the full range of scattered electrons and even for exploring novel atomic-resolution imaging modes by post-processing combination of the individual images.
一种用于原子分辨率扫描透射电子显微镜（STEM）的新型面积探测器被研发并测试。该圆形探测器被分为16个部分，这些部分分别与光电倍增管进行光学耦合。因此，可以同时获得16幅对探测器平面上散射电子空间分布敏感的原子分辨率STEM图像。这种新型探测器不仅有可能用于同时形成普通明场、低角度环形暗场和高角度环形暗场图像，还能通过检测全范围的散射电子进行图像量化，甚至通过对单个图像进行后处理组合来探索新型原子分辨率成像模式。
