Migunov Vadim, Ryll Henning, Zhuge Xiaodong, Simson Martin, Strüder Lothar, Batenburg K Joost, Houben Lothar, Dunin-Borkowski Rafal E
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, D-52425 Jülich, Germany.
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 München, Germany.
Sci Rep. 2015 Oct 5;5:14516. doi: 10.1038/srep14516.
We demonstrate the ability to record a tomographic tilt series containing 3487 images in only 3.5 s by using a direct electron detector in a transmission electron microscope. The electron dose is lower by at least one order of magnitude when compared with that used to record a conventional tilt series of fewer than 100 images in 15-60 minutes and the overall signal-to-noise ratio is greater than 4. Our results, which are illustrated for an inorganic nanotube, are important for ultra-low-dose electron tomography of electron-beam-sensitive specimens and real-time dynamic electron tomography of nanoscale objects with sub-ms temporal resolution.
我们展示了在透射电子显微镜中使用直接电子探测器仅用3.5秒就能记录包含3487张图像的断层倾斜序列的能力。与在15至60分钟内记录少于100张图像的传统倾斜序列所使用的电子剂量相比，电子剂量降低了至少一个数量级，并且整体信噪比大于4。我们以无机纳米管为例的结果，对于电子束敏感样品的超低剂量电子断层扫描以及具有亚毫秒时间分辨率的纳米级物体的实时动态电子断层扫描具有重要意义。
