Mukherjee Subhrajit, Maiti Rishi, Katiyar Ajit K, Das Soumen, Ray Samit K
Advanced Technology Development Centre, Indian Institute of Technology, Kharagpur- 721302, India.
Department of Physics, Indian Institute of Technology, Kharagpur- 721302, India.
Sci Rep. 2016 Jun 30;6:29016. doi: 10.1038/srep29016.
Silicon compatible wafer scale MoS2 heterojunctions are reported for the first time using colloidal quantum dots. Size dependent direct band gap emission of MoS2 dots are presented at room temperature. The temporal stability and decay dynamics of excited charge carriers in MoS2 quantum dots have been studied using time correlated single photon counting spectroscopy technique. Fabricated n-MoS2/p-Si 0D/3D heterojunctions exhibiting excellent rectification behavior have been studied for light emission in the forward bias and photodetection in the reverse bias. The electroluminescences with white light emission spectra in the range of 450-800 nm are found to be stable in the temperature range of 10-350 K. Size dependent spectral responsivity and detectivity of the heterojunction devices have been studied. The peak responsivity and detectivity of the fabricated heterojunction detector are estimated to be ~0.85 A/W and ~8 × 10(11) Jones, respectively at an applied bias of -2 V for MoS2 QDs of 2 nm mean diameter. The above values are found to be superior to the reported results on large area photodetector devices fabricated using two dimensional materials.
首次报道了使用胶体量子点的硅兼容晶圆级二硫化钼异质结。展示了室温下二硫化钼量子点尺寸依赖的直接带隙发射。利用时间相关单光子计数光谱技术研究了二硫化钼量子点中激发电荷载流子的时间稳定性和衰减动力学。对制备的表现出优异整流行为的n型二硫化钼/p型硅0D/3D异质结进行了正向偏压下的发光和反向偏压下的光电探测研究。发现在450 - 800纳米范围内具有白色发光光谱的电致发光在10 - 350 K的温度范围内是稳定的。研究了异质结器件的尺寸依赖光谱响应度和探测率。对于平均直径为2纳米的二硫化钼量子点,在施加-2 V偏压时,制备的异质结探测器的峰值响应度和探测率估计分别约为0.85 A/W和~8×10(11)琼斯。发现上述值优于使用二维材料制造的大面积光电探测器器件的报道结果。