Gamble Lara J, Anderton Christopher R
Molecular Engr. And Sci. Bldg, Box 351653, University of Washington (NESACBIO), Seattle, WA 98195, USA.
Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, 902 Battelle Boulevard, Richland, WA 99352, USA.
Micros Today. 2016 Mar;24(2):24-31. doi: 10.1017/S1551929516000018. Epub 2016 Mar 18.
Secondary ion mass spectrometry (SIMS) is a technique capable of imaging tissues, single cells, and microbes revealing chemical species with sub-micrometer spatial resolution. The recently developed Fourier transform ion cyclotron resonance (FTICR) SIMS instrument provides high mass resolving power and mass accuracy, ToF-SIMS can generate chemical maps with an order of magnitude better lateral resolution than the FTICR-SIMS, and the NanoSIMS instrument offers sub-100 nm spatial resolution in chemical imaging. Many commercial ToF-SIMS instruments are also capable of depth profiling that allows three-dimensional reconstructions of cell and tissue structure.
二次离子质谱（SIMS）是一种能够对组织、单细胞和微生物进行成像的技术，可揭示具有亚微米空间分辨率的化学物质。最近开发的傅里叶变换离子回旋共振（FTICR）SIMS仪器具有高分辨率和质量精度，飞行时间二次离子质谱（ToF-SIMS）能够生成横向分辨率比FTICR-SIMS高一个数量级的化学图谱，而纳米二次离子质谱（NanoSIMS）仪器在化学成像中提供亚100纳米的空间分辨率。许多商用ToF-SIMS仪器也能够进行深度剖析，从而实现细胞和组织结构的三维重建。
