Suppr超能文献

厚度相关的 MoS 场效应晶体管肖特基势垒高度。

Thickness-dependent Schottky barrier height of MoS field-effect transistors.

机构信息

Department of Materials Science and Engineering, Yonsei University, Seoul, 03722, Korea.

出版信息

Nanoscale. 2017 May 11;9(18):6151-6157. doi: 10.1039/c7nr01501a.

Abstract

2D semiconductors, including transition metal dichalcogenides (TMDs), have been widely studied recently. However, the device performance is deteriorated due to the significant contact resistance. The contact resistance of MoS-metal contacts decreases with the thickness of MoS. We obtained a Schottky barrier height as low as about 70 meV when MoS is trilayer-thick. It is important to find the optimal choice of contact metal and layer thickness of MoS.

摘要

二维半导体,包括过渡金属二硫属化物(TMDs),最近受到了广泛的研究。然而,由于显著的接触电阻,器件性能会恶化。MoS 与金属的接触电阻随 MoS 厚度的减少而降低。当 MoS 为三层厚度时,我们得到了低至约 70meV 的肖特基势垒高度。找到 MoS 的最佳接触金属和层厚选择非常重要。

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验