Pauw B R, Smith A J, Snow T, Terrill N J, Thünemann A F
Bundesanstalt für Materialforschung und -prüfung (BAM), 12205 Berlin, Germany.
Diamond Light Source Ltd, Diamond House, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, UK.
J Appl Crystallogr. 2017 Nov 29;50(Pt 6):1800-1811. doi: 10.1107/S1600576717015096. eCollection 2017 Dec 1.
Data correction is probably the least favourite activity amongst users experimenting with small-angle X-ray scattering: if it is not done sufficiently well, this may become evident only during the data analysis stage, necessitating the repetition of the data corrections from scratch. A recommended comprehensive sequence of elementary data correction steps is presented here to alleviate the difficulties associated with data correction, both in the laboratory and at the synchrotron. When applied in the proposed order to the raw signals, the resulting absolute scattering cross section will provide a high degree of accuracy for a very wide range of samples, with its values accompanied by uncertainty estimates. The method can be applied without modification to any pinhole-collimated instruments with photon-counting direct-detection area detectors.
在进行小角X射线散射实验的用户中,数据校正可能是最不受欢迎的操作:如果做得不够好,可能只有在数据分析阶段才会显现出来,这就需要从头重新进行数据校正。本文提出了一套推荐的基本数据校正步骤的综合序列,以减轻在实验室和同步加速器中与数据校正相关的困难。按照建议的顺序应用于原始信号时,所得的绝对散射截面将为非常广泛的样品提供高度的准确性,其值还伴有不确定度估计。该方法无需修改即可应用于任何配备光子计数直接探测面积探测器的针孔准直仪器。