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Bandgap-Engineered Zinc-Tin-Oxide Thin Films for Ultraviolet Sensors.

作者信息

Cheng Tien-Hung, Chang Sheng-Po, Chang Shoou-Jinn

机构信息

Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 701, Taiwan.

出版信息

J Nanosci Nanotechnol. 2018 Jul 1;18(7):4930-4934. doi: 10.1166/jnn.2018.15323.

DOI:10.1166/jnn.2018.15323
PMID:29442676
Abstract

Zinc-tin-oxide thin-film transistors were prepared by radio frequency magnetron co-sputtering, while an identical zinc-tin-oxide thin film was deposited simultaneously on a clear glass substrate to facilitate measurements of the optical properties. When we adjusted the deposition power of ZnO and SnO2, the bandgap of the amorphous thin film was dominated by the deposition power of SnO2. Since the thin-film transistor has obvious absorption in the ultraviolet region owing to the wide bandgap, the drain current increases with the generation of electron-hole pairs. As part of these investigations, a zinc-tin-oxide thin-film transistor has been fabricated that appears to be very promising for ultraviolet applications.

摘要

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