Kainz Andreas, Steiner Harald, Schalko Johannes, Jachimowicz Artur, Kohl Franz, Stifter Michael, Beigelbeck Roman, Keplinger Franz, Hortschitz Wilfried
Institute of Sensor and Actuator Systems, TU Wien, Vienna, Austria.
Center of Integrated Sensor Systems, Danube University Krems, Wr. Neustadt, Austria.
Nat Electron. 2018 Jan 8;1:68-73. doi: 10.1038/s41928-017-0009-5.
Small-scale and distortion-free measurement of electric fields is crucial for applications such as surveying atmospheric electrostatic fields, lightning research, and safeguarding areas close to high-voltage power lines. A variety of measurement systems exist, the most common of which are field mills, which work by picking up the differential voltage of the measurement electrodes while periodically shielding them with a grounded electrode. However, all current approaches are either bulky, suffer from a strong temperature dependency, or severely distort the electric field requiring a well-defined surrounding and complex calibration procedures. Here we show that microelectromechanical system (MEMS) devices can be used to measure electric field strength without significant field distortion. The purely passive MEMS devices exploit the effect of electrostatic induction, which is used to generate internal forces that are converted into an optically tracked mechanical displacement of a spring-suspended seismic mass. The devices exhibit resolutions on the order of [Formula: see text] with a measurement range of up to tens of kilovolt per metre in the quasi-static regime (≲ 300 Hz).We also show that it should be possible to achieve resolutions of around [Formula: see text] by fine-tuning of the sensor embodiment. These MEMS devices are compact and could easily be mass produced for wide application.
对电场进行小规模且无失真的测量对于诸如测量大气静电场、雷电研究以及保护靠近高压输电线的区域等应用至关重要。现存在多种测量系统,其中最常见的是场强计,它通过在周期性地用接地电极屏蔽测量电极的同时拾取测量电极的差分电压来工作。然而,目前所有的方法要么体积庞大,要么对温度依赖性很强,要么会严重扭曲电场,这就需要明确的环境条件和复杂的校准程序。在此我们表明,微机电系统(MEMS)器件可用于测量电场强度而不会产生明显的场失真。这些纯无源的MEMS器件利用静电感应效应,该效应被用于产生内力,这些内力会被转换为弹簧悬挂的地震质量块的光学跟踪机械位移。在准静态状态(≲300Hz)下,这些器件的分辨率可达[公式:见原文]量级,测量范围高达每米数十千伏。我们还表明,通过对传感器实施方式进行微调,应该有可能实现约[公式:见原文]的分辨率。这些MEMS器件体积紧凑,并且能够很容易地进行大规模生产以实现广泛应用。