Swiss Light Source, Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Acta Crystallogr D Struct Biol. 2019 Feb 1;75(Pt 2):211-218. doi: 10.1107/S2059798319000317. Epub 2019 Jan 28.
Radiation damage is still the most limiting factor in obtaining high-resolution structures of macromolecules in crystallographic experiments at synchrotrons. With the advent of X-ray free-electron lasers (XFELs) that produce ultrashort and highly intense X-ray pulses, it became possible to outrun most of the radiation-damage processes occurring in the sample during exposure to XFEL radiation. Although this is generally the case, several experimental and theoretical studies have indicated that structures from XFELs may not always be radiation-damage free. This is especially true when higher intensity pulses are used and protein molecules that contain heavy elements in their structures are studied. Here, the radiation-damage mechanisms that occur in samples exposed to XFEL pulses are summarized, results that show indications of radiation damage are reviewed and methods that can partially overcome it are discussed.
在同步加速器晶体学实验中,获得大分子的高分辨率结构仍然受到辐射损伤的最严重限制。随着产生超短和高强度 X 射线脉冲的自由电子 X 射线激光器(XFEL)的出现,有可能在 XFEL 辐射照射期间在样品中发生的大多数辐射损伤过程之前完成实验。尽管通常如此,但一些实验和理论研究表明,XFEL 的结构并不总是无辐射损伤的。当使用更高强度的脉冲并且研究结构中含有重元素的蛋白质分子时,尤其如此。在这里,总结了暴露于 XFEL 脉冲的样品中发生的辐射损伤机制,综述了显示辐射损伤迹象的结果,并讨论了可以部分克服该损伤的方法。