Radamson Henry H, He Xiaobin, Zhang Qingzhu, Liu Jinbiao, Cui Hushan, Xiang Jinjuan, Kong Zhenzhen, Xiong Wenjuan, Li Junjie, Gao Jianfeng, Yang Hong, Gu Shihai, Zhao Xuewei, Du Yong, Yu Jiahan, Wang Guilei
Key Laboratory of Microelectronics Devices & Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China.
Microelectronics Institute, University of Chinese Academy of Sciences, Beijing 100049, China.
Micromachines (Basel). 2019 Apr 30;10(5):293. doi: 10.3390/mi10050293.
When the international technology roadmap of semiconductors (ITRS) started almost five decades ago, the metal oxide effect transistor (MOSFET) as units in integrated circuits (IC) continuously miniaturized. The transistor structure has radically changed from its original planar 2D architecture to today's 3D Fin field-effect transistors (FinFETs) along with new designs for gate and source/drain regions and applying strain engineering. This article presents how the MOSFET structure and process have been changed (or modified) to follow the More Moore strategy. A focus has been on methodologies, challenges, and difficulties when ITRS approaches the end. The discussions extend to new channel materials beyond the Moore era.
大约五十年前,当国际半导体技术路线图(ITRS)启动时,作为集成电路(IC)单元的金属氧化物效应晶体管(MOSFET)不断小型化。随着栅极和源极/漏极区域的新设计以及应变工程的应用,晶体管结构已从其最初的平面二维架构彻底转变为如今的三维鳍式场效应晶体管(FinFET)。本文介绍了MOSFET结构和工艺是如何改变(或改进)以遵循“更多摩尔”策略的。重点关注了ITRS接近尾声时的方法、挑战和困难。讨论还扩展到了摩尔时代之后的新型沟道材料。