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恢复空间维度:通过选择性区域外延生长的可机械转移的二维砷化铟纳米鳍

Regaining a Spatial Dimension: Mechanically Transferrable Two-Dimensional InAs Nanofins Grown by Selective Area Epitaxy.

作者信息

Seidl J, Gluschke J G, Yuan X, Naureen S, Shahid N, Tan H H, Jagadish C, Micolich A P, Caroff P

机构信息

School of Physics , University of New South Wales , Sydney NSW 2052 , Australia.

Department of Electronic Materials Engineering, Research School of Physics and Engineering , The Australian National University , Canberra ACT 2601 , Australia.

出版信息

Nano Lett. 2019 Jul 10;19(7):4666-4677. doi: 10.1021/acs.nanolett.9b01703. Epub 2019 Jun 26.

Abstract

We report a method for growing rectangular InAs nanofins with deterministic length, width, and height by dielectric-templated selective-area epitaxy. These freestanding nanofins can be transferred to lay flat on a separate substrate for device fabrication. A key goal was to regain a spatial dimension for device design compared to nanowires, while retaining the benefits of bottom-up epitaxial growth. The transferred nanofins were made into devices featuring multiple contacts for Hall effect and four-terminal resistance studies, as well as a global back-gate and nanoscale local top-gates for density control. Hall studies give a 3D electron density 2.5-5 × 10 cm, corresponding to an approximate surface accumulation layer density 3-6 × 10 cm that agrees well with previous studies of InAs nanowires. We obtain Hall mobilities as high as 1200 cm/(V s), field-effect mobilities as high as 4400 cm/(V s), and clear quantum interference structure at temperatures as high as 20 K. Our devices show excellent prospects for fabrication into more complicated devices featuring multiple ohmic contacts, local gates, and possibly other functional elements, for example, patterned superconductor contacts, that may make them attractive options for future quantum information applications.

摘要

我们报道了一种通过介电模板选择性区域外延生长具有确定长度、宽度和高度的矩形铟砷纳米鳍的方法。这些独立的纳米鳍可以转移到另一个衬底上平躺,用于器件制造。一个关键目标是与纳米线相比,重新获得器件设计的空间维度,同时保留自下而上外延生长的优势。转移后的纳米鳍被制成具有多个用于霍尔效应和四端电阻研究的触点的器件,以及用于密度控制的全局背栅和纳米级局部顶栅。霍尔研究给出的三维电子密度为2.5 - 5×10¹⁷ cm⁻³,对应于约3 - 6×10¹² cm⁻²的表面积累层密度,这与之前对铟砷纳米线的研究结果吻合良好。我们获得了高达1200 cm²/(V·s)的霍尔迁移率、高达4400 cm²/(V·s)的场效应迁移率,并且在高达20 K的温度下有清晰的量子干涉结构。我们的器件在制造成具有多个欧姆接触、局部栅极以及可能的其他功能元件(例如图案化超导接触)的更复杂器件方面显示出极好的前景,这可能使它们成为未来量子信息应用的有吸引力的选择。

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