Khoo Ting Chean, Sharikova Anna, Khmaladze Alexander
Physics Department, SUNY University at Albany, 1400 Washington Avenue, Albany, NY 12222 USA.
Opt Commun. 2020 Mar 1;458. doi: 10.1016/j.optcom.2019.124793. Epub 2019 Oct 22.
We present a dual wavelength digital holographic technique for three-dimensional microscopic imaging of layered structures, where layers are separated from one another by the axial distances exceeding the wavelength of imaging light. Our methodology not only provides the three-dimensional structure of each layer, but also allows the height differentiation of distinct layers. We have also implemented a technique suppressing low intensity signal when no reliable phase information can be extracted, based on the quality of the interference fringe pattern. We utilize a dual wavelength setup, where the combination of two overlapping interferometers enables simultaneous acquisition of two phase profiles. We demonstrate that this imaging modality is particularly well-suited for imaging of multilayered electrode structures embedded in glass.
我们提出了一种用于层状结构三维显微成像的双波长数字全息技术，其中各层之间的轴向距离超过成像光的波长。我们的方法不仅能提供每层的三维结构，还能实现不同层之间的高度区分。基于干涉条纹图案的质量，我们还实现了一种在无法提取可靠相位信息时抑制低强度信号的技术。我们采用双波长设置，两个重叠干涉仪的组合能够同时采集两个相位分布。我们证明这种成像方式特别适合对嵌入玻璃中的多层电极结构进行成像。
