Dörling Bernhard, Zapata-Arteaga Osnat, Campoy-Quiles Mariano
Materials Science Institute of Barcelona (ICMAB-CSIC), Campus of the UAB, 08193 Bellaterra, Barcelona, Spain.
Rev Sci Instrum. 2020 Oct 1;91(10):105111. doi: 10.1063/5.0021715.
This work documents an all-in-one custom setup that allows us to measure the in-plane Seebeck coefficients and electrical conductivities of anisotropic thin film samples close to room temperature. Both pairs, S and σ and S and σ, can be measured using four contacts on the same sample, reducing measurement time and minimizing potential sources of error due to aggregating data from several distinct samples. The setup allows us to measure the electrical conductivity of isotropic samples using the well-known van der Pauw method. For samples with in-plane anisotropy, the two components σ and σ can be extracted from the same type of measurements by performing additional calculations. Using the same contacts, the Seebeck coefficient along one direction is measured using a differential steady-state method. After rotating the sample by 90°, the orthogonal Seebeck component can be measured. In order to show the generality of the method, we measure different types of samples, from metal references to oriented doped conjugated polymers.
这项工作记录了一种一体化的定制装置，它使我们能够在接近室温的条件下测量各向异性薄膜样品的面内塞贝克系数和电导率。S与σ以及S与σ这两对参数，都可以通过在同一样品上的四个触点进行测量，从而减少测量时间，并将因汇总多个不同样品的数据而产生的潜在误差源降至最低。该装置使我们能够使用著名的范德堡方法测量各向同性样品的电导率。对于具有面内各向异性的样品，通过执行额外的计算，可以从同一类型的测量中提取σ和σ这两个分量。使用相同的触点，沿一个方向的塞贝克系数采用差分稳态方法进行测量。将样品旋转90°后，就可以测量正交的塞贝克分量。为了展示该方法的通用性，我们测量了不同类型的样品，从金属参比物到取向掺杂共轭聚合物。
