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基于二维材料的固态电子器件的产率、变异性、可靠性和稳定性。

Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices.

机构信息

Physical Sciences and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal, 23955-6900, Saudi Arabia.

IMEC, Kapeldreef 75, 3001, Heverlee (Leuven), Belgium.

出版信息

Nat Commun. 2020 Nov 10;11(1):5689. doi: 10.1038/s41467-020-19053-9.

DOI:10.1038/s41467-020-19053-9
PMID:33173041
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC7655834/
Abstract

The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline viable strategies resulting in research papers that are useful for the industry.

摘要

二维材料基电子器件和电路的统计分析的重要性有时被忽视。在这里,作者讨论了这些器件最紧迫的集成问题,并强调了需要对产量、可变性、可靠性和稳定性进行基准测试,并概述了可行的策略,从而产生对工业有用的研究论文。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/109a/7655834/2bd7bf0343e4/41467_2020_19053_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/109a/7655834/2bd7bf0343e4/41467_2020_19053_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/109a/7655834/2bd7bf0343e4/41467_2020_19053_Fig1_HTML.jpg

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