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降低高频噪声对表面形貌测量结果的影响。

Reduction of Influence of the High-Frequency Noise on the Results of Surface Topography Measurements.

作者信息

Podulka Przemysław

机构信息

Faculty of Mechanical Engineering and Aeronautics, Rzeszow University of Technology, Powstancow Warszawy 8 Street, 35-959 Rzeszów, Poland.

出版信息

Materials (Basel). 2021 Jan 11;14(2):333. doi: 10.3390/ma14020333.

DOI:10.3390/ma14020333
PMID:33440709
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC7827278/
Abstract

The influence of errors in the processes of detection and then reduction of surface topography measurement noise is of great importance; many research papers are concerned with the definition of this type of measurement error. This paper presents the influence of high-frequency measurement noise, defined for various types of surface textures, e.g., two-process plateau-honed, turned, ground, or isotropic. Procedures for the processing of raw measured data as a detection of the high-frequency errors from the results of surface topography measurements were proposed and verified (compared) according to the commonly used (available in the commercial software of the measuring equipment) algorithms. It was assumed that commonly used noise-separation algorithms did not always provide consistent results for two process textures with the valley-extraction analysis; as a result, some free-of-dimple (part of the analyzed detail where dimples do not exist) areas were not carefully considered. Moreover, the influence of measured data processing errors on surface topography parameter calculation was not comprehensively studied with high-frequency measurement noise assessments. It was assumed that the application of the Wavelet Noise Extraction Procedure (WNEP) might be exceedingly valuable when the reduction of a disparate range of measured frequencies (measurement noise) was carefully considered.

摘要

检测及随后降低表面形貌测量噪声过程中误差的影响至关重要；许多研究论文都涉及此类测量误差的定义。本文介绍了针对各种类型表面纹理（例如双行程平台珩磨、车削、磨削或各向同性）定义的高频测量噪声的影响。提出了处理原始测量数据的程序，作为从表面形貌测量结果中检测高频误差的方法，并根据常用的（测量设备商业软件中可用的）算法进行了验证（比较）。假设常用的噪声分离算法对于具有谷底提取分析的双行程纹理并不总是能提供一致的结果；因此，一些无凹坑区域（分析细节中不存在凹坑的部分）未得到仔细考虑。此外，在高频测量噪声评估中，未全面研究测量数据处理误差对表面形貌参数计算的影响。假设当仔细考虑降低不同范围的测量频率（测量噪声）时，应用小波噪声提取程序（WNEP）可能会非常有价值。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/a5b9f9580570/materials-14-00333-g012.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/4f7f2369c667/materials-14-00333-g001a.jpg
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https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/fd0fc04be3db/materials-14-00333-g005a.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/5046102802af/materials-14-00333-g006a.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/a0d07b102748/materials-14-00333-g007a.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/d83d6a1d9945/materials-14-00333-g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/d53eef901ba5/materials-14-00333-g009a.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/4ad6e7b4190b/materials-14-00333-g010.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/2cbb1258414f/materials-14-00333-g011.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/a5b9f9580570/materials-14-00333-g012.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/4f7f2369c667/materials-14-00333-g001a.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/02d5e25e63c6/materials-14-00333-g002a.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/bc171e0eb707/materials-14-00333-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/d9c9d33e3303/materials-14-00333-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/fd0fc04be3db/materials-14-00333-g005a.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/5046102802af/materials-14-00333-g006a.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/a0d07b102748/materials-14-00333-g007a.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/d83d6a1d9945/materials-14-00333-g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/d53eef901ba5/materials-14-00333-g009a.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/4ad6e7b4190b/materials-14-00333-g010.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/2cbb1258414f/materials-14-00333-g011.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7fea/7827278/a5b9f9580570/materials-14-00333-g012.jpg

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