Suppr超能文献

通过热处理实现高质量二硫化钼纳米片的简便剥离及相关场效应晶体管的制备

Facile Exfoliation for High-Quality Molybdenum Disulfide Nanoflakes and Relevant Field-Effect Transistors Developed With Thermal Treatment.

作者信息

Zhang Yu, Chen Xiong, Zhang Hao, Hu Shaozu, Zhao Guohong, Zhang Meifang, Qin Wei, Wang Zhaohua, Huang Xiaowei, Wang Jun

机构信息

Organic Optoelectronics Engineering Research Center of Fujian's Universities, College of Electronics and Information Science, Fujian Jiangxia University, Fuzhou, China.

Fujian Innovation Center of Additive Manufacturing, Fuzhou, China.

出版信息

Front Chem. 2021 Apr 26;9:650901. doi: 10.3389/fchem.2021.650901. eCollection 2021.

Abstract

Molybdenum disulfide (MoS), a typical member of the transition metal dichalcogenides (TMDs) group, is known for its excellent electronic performance and is considered a candidate next-generation semiconductor. The preparation of MoS nanoflakes for use as the core of semiconducting devices depends on mechanical exfoliation, but its quality has not yet been optimized. In this paper, a novel exfoliation method of achieving MoS nanoflakes is proposed. We find that the size and yield of the exfoliated flakes are improved after thermal treatment for 2 h at a temperature of 110°C followed by precooling for 10 min in ambient air. The new method has the advantage of a 152-fold larger size of obtained MoS flakes than traditional mechanical exfoliation. This phenomenon may be attributable to the differences in van Der Waals force and the increase in surface free energy at the interface induced by thermal treatment. In addition, a field-effect transistor (FET) was fabricated on the basis of multilayer MoS prepared according to a new process, and the device exhibited a typical depleted-FET performance, with an on/off ratio of ~10 and a field-effect mobility of 24.26 cm/Vs in the saturated region when is 10 V, which is generally consistent with the values for devices reported previously. This implies that the new process may have potential for the standard preparation of MoS and even other 2D materials as well.

摘要

二硫化钼(MoS)是过渡金属二硫属化物(TMDs)家族的典型成员,以其优异的电子性能而闻名,被认为是下一代半导体的候选材料。用作半导体器件核心的MoS纳米片的制备依赖于机械剥离,但其质量尚未得到优化。本文提出了一种制备MoS纳米片的新型剥离方法。我们发现,在110°C下热处理2小时,然后在环境空气中预冷10分钟后,剥离薄片的尺寸和产量得到了改善。新方法的优点是获得的MoS薄片尺寸比传统机械剥离法大152倍。这种现象可能归因于范德华力的差异以及热处理引起的界面处表面自由能的增加。此外,基于新工艺制备的多层MoS制造了场效应晶体管(FET),该器件表现出典型的耗尽型FET性能,当栅极电压为10 V时,饱和区的开/关比约为10,场效应迁移率为24.26 cm²/V·s,这与先前报道的器件值基本一致。这意味着新工艺可能在MoS甚至其他二维材料的标准制备方面具有潜力。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7697/8109793/d8ec7d7d508a/fchem-09-650901-g0001.jpg

文献AI研究员

20分钟写一篇综述,助力文献阅读效率提升50倍。

立即体验

用中文搜PubMed

大模型驱动的PubMed中文搜索引擎

马上搜索

文档翻译

学术文献翻译模型,支持多种主流文档格式。

立即体验