Zhevnenko Dmitry Alexeevich, Meshchaninov Fedor Pavlovich, Kozhevnikov Vladislav Sergeevich, Shamin Evgeniy Sergeevich, Telminov Oleg Alexandrovich, Gornev Evgeniy Sergeevich
Moscow Institute of Physics and Technology, 9 Institutskiy per., Dolgoprudny, 141701 Moscow, Russia.
Joint-Stock Company "Molecular Electronics Research Institute" (JSC MERI), 12/1 1st Zapadnyi Proezd, Zelenograd, 124460 Moscow, Russia.
Micromachines (Basel). 2021 Oct 6;12(10):1220. doi: 10.3390/mi12101220.
Memristors are among the most promising devices for building neural processors and non-volatile memory. One circuit design stage involves modeling, which includes the option of memristor models. The most common approach is the use of compact models, the accuracy of which is often determined by the accuracy of their parameter extraction from experiment results. In this paper, a review of existing extraction methods was performed and new parameter extraction algorithms for an adaptive compact model were proposed. The effectiveness of the developed methods was confirmed for the volt-ampere characteristic of a memristor with a vertical structure: TiN/HfAlO/HfO/TiN.
忆阻器是构建神经处理器和非易失性存储器最具前景的器件之一。电路设计的一个阶段涉及建模,其中包括忆阻器模型的选择。最常见的方法是使用紧凑模型,其准确性通常取决于从实验结果中提取参数的准确性。本文对现有的提取方法进行了综述,并提出了一种用于自适应紧凑模型的新参数提取算法。所开发方法的有效性在具有垂直结构TiN/HfAlO/HfO/TiN的忆阻器的伏安特性上得到了证实。