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多光子成像中二元检测的散粒噪声限制

Shot noise limits on binary detection in multiphoton imaging.

作者信息

LaViolette Aaron K, Xu Chris

机构信息

School of Applied and Engineering Physics, Cornell University, Ithaca NY 14853, USA.

出版信息

Biomed Opt Express. 2021 Oct 20;12(11):7033-7048. doi: 10.1364/BOE.442442. eCollection 2021 Nov 1.

Abstract

Much of fluorescence-based microscopy involves detection of if an object is present or absent (i.e., binary detection). The imaging depth of three-dimensionally resolved imaging, such as multiphoton imaging, is fundamentally limited by out-of-focus background fluorescence, which when compared to the in-focus fluorescence makes detecting objects in the presence of noise difficult. Here, we use detection theory to present a statistical framework and metric to quantify the quality of an image when binary detection is of interest. Our treatment does not require acquired or reference images, and thus allows for a theoretical comparison of different imaging modalities and systems.

摘要

基于荧光的显微镜成像大多涉及检测物体是否存在(即二元检测)。三维分辨成像(如多光子成像)的成像深度从根本上受到离焦背景荧光的限制,与聚焦荧光相比,这使得在存在噪声的情况下检测物体变得困难。在这里,我们运用检测理论提出一个统计框架和度量标准,以在二元检测受到关注时量化图像质量。我们的方法不需要采集的图像或参考图像,因此可以对不同的成像模式和系统进行理论比较。

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Shot noise limits on binary detection in multiphoton imaging.多光子成像中二元检测的散粒噪声限制
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Nat Methods. 2020 Feb;17(2):163-166. doi: 10.1038/s41592-019-0663-9. Epub 2019 Dec 2.

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