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在容错阈值下对半导体自旋量子比特进行同时单量子比特驱动。

Simultaneous single-qubit driving of semiconductor spin qubits at the fault-tolerant threshold.

机构信息

QuTech and Kavli Institute of Nanoscience, Delft University of Technology, Delft, the Netherlands.

QuTech and Netherlands Organisation for Applied Scientific Research (TNO), Delft, the Netherlands.

出版信息

Nat Commun. 2023 Jun 19;14(1):3617. doi: 10.1038/s41467-023-39334-3.

Abstract

Practical Quantum computing hinges on the ability to control large numbers of qubits with high fidelity. Quantum dots define a promising platform due to their compatibility with semiconductor manufacturing. Moreover, high-fidelity operations above 99.9% have been realized with individual qubits, though their performance has been limited to 98.67% when driving two qubits simultaneously. Here we present single-qubit randomized benchmarking in a two-dimensional array of spin qubits, finding native gate fidelities as high as 99.992(1)%. Furthermore, we benchmark single qubit gate performance while simultaneously driving two and four qubits, utilizing a novel benchmarking technique called N-copy randomized benchmarking, designed for simple experimental implementation and accurate simultaneous gate fidelity estimation. We find two- and four-copy randomized benchmarking fidelities of 99.905(8)% and 99.34(4)% respectively, and that next-nearest neighbor pairs are highly robust to cross-talk errors. These characterizations of single-qubit gate quality are crucial for scaling up quantum information technology.

摘要

实用量子计算依赖于以高保真度控制大量量子比特的能力。量子点由于与半导体制造的兼容性,定义了一个很有前途的平台。此外,已经实现了单个量子比特的超过 99.9%的高保真度操作,尽管当同时驱动两个量子比特时,其性能限制在 98.67%。在这里,我们在二维自旋量子比特阵列中展示了单量子比特随机基准测试,发现固有门保真度高达 99.992(1)%。此外,我们在同时驱动两个和四个量子比特的同时基准测试单量子比特门性能,利用一种称为 N 拷贝随机基准测试的新基准测试技术,该技术旨在进行简单的实验实现和准确的同时门保真度估计。我们发现两拷贝和四拷贝随机基准测试的保真度分别为 99.905(8)%和 99.34(4)%,并且最近邻对对于串扰误差具有很高的鲁棒性。这些单量子比特门质量的特性对于扩展量子信息技术至关重要。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7564/10279658/36bb9997f4d7/41467_2023_39334_Fig1_HTML.jpg

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