Yang Zewen, Zhang Lu, Liu Tong, Wu Haoyu, Tang Zhiyuan, Fan Chen, Liu Xiaolong, Zhang Zhenxi, Zhao Hong
State Key Laboratory for Manufacturing System Engineering, School of Mechanical Engineering, Xi'an Jiaotong University, Xi'an 710049, China.
Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China.
Biomed Opt Express. 2023 Aug 14;14(9):4696-4712. doi: 10.1364/BOE.497681. eCollection 2023 Sep 1.
LED array microscopy is a novel computational imaging technique that can achieve two-dimensional (2D) phase imaging and three-dimensional (3D) refractive index imaging with both high resolution and a large field of view. Although its experimental setup is simple, the errors caused by LED array position and light source central wavelength obviously decrease the quality of reconstructed results. To solve this problem, comprehensive error parameters optimized by the phase smoothing criterion are put forward in this paper. The central wavelength error and 3D misalignment model with six freedom degree errors of LED array are considered as the comprehensive error parameters when the spatial positional and optical features of arbitrarily placed LED array are unknown. Phase smoothing criterion is also introduced to the cost function for optimizing comprehensive error parameters to improve the convergence results. Compared with current system correction methods, the simulation and experimental results show that the proposed method in this paper has the best reconstruction accuracy, which can be well applied to an LED array microscope system with unknown positional and optical features of the LED array.
发光二极管（LED）阵列显微镜是一种新型的计算成像技术，它能够实现高分辨率和大视场的二维（2D）相位成像和三维（3D）折射率成像。尽管其实验装置简单，但LED阵列位置和光源中心波长所引起的误差明显降低了重建结果的质量。为了解决这个问题，本文提出了通过相位平滑准则优化的综合误差参数。当任意放置的LED阵列的空间位置和光学特征未知时，将中心波长误差和具有六个自由度误差的LED阵列三维错位模型作为综合误差参数。相位平滑准则也被引入到代价函数中，以优化综合误差参数，从而改善收敛结果。与当前的系统校正方法相比，仿真和实验结果表明，本文所提出的方法具有最佳的重建精度，能够很好地应用于LED阵列位置和光学特征未知的LED阵列显微镜系统。
