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候选基因在普通小麦(Triticum aestivum L.)Lr46/Yr29“慢锈”位点的表达模式及其相关miRNA 信息赋予了抗条锈病基因。

Expression patterns of candidate genes for the Lr46/Yr29 "slow rust" locus in common wheat (Triticum aestivum L.) and associated miRNAs inform of the gene conferring the Puccinia triticina resistance trait.

机构信息

Department of Genetics and Plant Breeding, Poznań University of Life Sciences, Poznań, Poland.

Plant Breeding and Acclimatization Institute - National Research Institute in Radzików, Poznań Division, Department of Oilseed Crops, Poznań, Poland.

出版信息

PLoS One. 2024 Sep 6;19(9):e0309944. doi: 10.1371/journal.pone.0309944. eCollection 2024.

DOI:10.1371/journal.pone.0309944
PMID:39240941
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC11379320/
Abstract

Leaf rust caused by Puccinia triticina (Pt) is one of the most impactful diseases causing substantial losses in common wheat (Triticum aestivum L.) crops. In adult plants resistant to Pt, a horizontal adult plant resistance (APR) is observed: APR protects the plant against multiple pathogen races and is distinguished by durable persistence under production conditions. The Lr46/Yr29 locus was mapped to chromosome 1B of common wheat genome, but the identity of the underlying gene has not been demonstrated although several candidate genes have been proposed. This study aimed to analyze the expression of nine candidate genes located at the Lr46/Yr29 locus and their four complementary miRNAs (tae-miR5384-3p, tae-miR9780, tae-miR9775, and tae-miR164), in response to Pt infection. The plant materials tested included five reference cultivars in which the molecular marker csLV46G22 associated with the Lr46/Yr29-based Pt resistance was identified, as well as one susceptible control cultivar. Biotic stress was induced in adult plants by inoculation with fungal spores under controlled conditions. Plant material was sampled before and at 6, 12, 24, 48 hours post inoculation (hpi). Differences in expression of candidate genes at the Lr46/Yr29 locus were analyzed by qRT-PCR and showed that the expression of the genes varied at the analyzed time points. The highest expression of Lr46/Yr29 candidate genes (Lr46-Glu1, Lr46-Glu2, Lr46-Glu3, Lr46-RLK1, Lr46-RLK2, Lr46-RLK3, Lr46-RLK4, Lr46-Snex, and Lr46-WRKY) occurred at 12 and 24 hpi and such expression profiles were obtained only for one candidate gene among the nine genes analyzed (Lr46-Glu2), indicating that it may be a contributing factor in the resistance response to Pt infection.

摘要

叶锈病由小麦叶锈菌(Puccinia triticina)引起,是影响普通小麦(Triticum aestivum L.)作物的最具破坏性的疾病之一。在对 Pt 具有抗性的成年植株中,观察到水平的成株抗性(APR):APR 保护植物免受多种病原体的侵害,并在生产条件下具有持久的持久性。Lr46/Yr29 基因座被定位到普通小麦基因组的 1B 染色体上,但尽管已经提出了几个候选基因,但其潜在基因的身份尚未得到证明。本研究旨在分析位于 Lr46/Yr29 基因座的九个候选基因及其四个互补 miRNA(tae-miR5384-3p、tae-miR9780、tae-miR9775 和 tae-miR164)的表达,以响应 Pt 感染。测试的植物材料包括五个参考品种,其中鉴定出与 Lr46/Yr29 相关的基于 Pt 抗性的分子标记 csLV46G22,以及一个易感对照品种。在受控条件下通过接种真菌孢子诱导成年植物的生物胁迫。在接种前和接种后 6、12、24、48 小时(hpi)取样植物材料。通过 qRT-PCR 分析 Lr46/Yr29 基因座候选基因的表达差异,结果表明基因的表达在分析的时间点有所不同。Lr46/Yr29 候选基因(Lr46-Glu1、Lr46-Glu2、Lr46-Glu3、Lr46-RLK1、Lr46-RLK2、Lr46-RLK3、Lr46-RLK4、Lr46-Snex 和 Lr46-WRKY)的最高表达发生在 12 和 24 hpi,并且仅在分析的九个基因中的一个候选基因(Lr46-Glu2)中获得了这种表达谱,这表明它可能是对 Pt 感染的抗性反应的一个促成因素。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6af7/11379320/ed254fd58824/pone.0309944.g006.jpg
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https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6af7/11379320/ed254fd58824/pone.0309944.g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6af7/11379320/98ca88dfd145/pone.0309944.g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6af7/11379320/e1d235d88868/pone.0309944.g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6af7/11379320/ec6424e6bcc2/pone.0309944.g003.jpg
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https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6af7/11379320/ed254fd58824/pone.0309944.g006.jpg

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