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硼磷氮化物BPN的结构、电子和热电性质:第一性原理研究

Structural, electronic and thermoelectric properties of boron phosphorous nitride BPN first principles study.

作者信息

Al-Qaisi Samah, Quraishi A M, Safeen Akif, Formanova Shoira, Tirth Vineet, Algahtani Ali, Almahri Albandary, Elboughdiri Noureddine, Mohammed Rawaa M, Hadia N M A, Alsuhaibani Amnah Mohammed, Refat Moamen S, Zaman Abid

机构信息

Department of Physics, Bacha Khan University Charsadda Pakistan

Palestinian Ministry of Education and Higher Education Nablus Palestine.

出版信息

RSC Adv. 2024 Sep 18;14(40):29526-29534. doi: 10.1039/d4ra04742g. eCollection 2024 Sep 12.

Abstract

A theoretical study of monolayer boron phosphorous nitride (BPN) is performed to explore its electronic and thermoelectric properties. The thermodynamic stability is determined by the formation energy of a monolayer. The dynamic stability is obtained from the phonon dispersion curve. We performed an AMID simulation to ensure the thermal stability and found that our material is thermally stable at 700 K. The system possesses direct band gaps of 0.25 eV and 0.4 eV with Perdew-Burke-Ernzerhof (PBE) and hybrid functional (HSE), respectively. The Seebeck coefficient is found to be the same in both directions, and the maximum value is 1.55 mV K. The relaxation time is found to be longer for the hole-doped system than the electron-doped system. It is observed that electrical conductivity is greater for hole-doped system in both directions, and a similar trend is observed for electronic thermal conductivity. We found that the lattice thermal conductivity of our systems is anisotropic. The lattice thermal conductivity along the -direction is greater than that in the -direction. The calculation performed for the figure of merit () reveals that the system has a high of 1.14 for a hole-doped system. The figure of merit makes the system a promising candidate for potential thermoelectric device applications.

摘要

对单层硼磷氮化物(BPN)进行了理论研究,以探索其电子和热电性能。热力学稳定性由单层的形成能决定。动态稳定性从声子色散曲线获得。我们进行了AMID模拟以确保热稳定性,发现我们的材料在700 K时是热稳定的。该系统在Perdew-Burke-Ernzerhof(PBE)和杂化泛函(HSE)下分别具有0.25 eV和0.4 eV的直接带隙。发现塞贝克系数在两个方向上相同,最大值为1.55 mV K。发现空穴掺杂系统的弛豫时间比电子掺杂系统更长。观察到空穴掺杂系统在两个方向上的电导率都更大,并且电子热导率也观察到类似趋势。我们发现我们系统的晶格热导率是各向异性的。沿z方向的晶格热导率大于沿x方向的。对品质因数(ZT)的计算表明,空穴掺杂系统的ZT值高达1.14。品质因数使该系统成为潜在热电装置应用的有前途的候选者。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/daaf/11409448/37a9763a58ce/d4ra04742g-f1.jpg

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