Prasad Ankush, Mihačová Eliška, Manoharan Renuka Ramalingam, Pospíšil Pavel
Department of Biophysics, Faculty of Science, Palacký University, Šlechtitelů 27, Olomouc, 779 00, Czech Republic.
J Plant Res. 2025 Mar;138(2):389-400. doi: 10.1007/s10265-024-01600-w. Epub 2025 Jan 5.
The oxidative damage induced by abiotic stress factors such as salinity, drought, extreme temperatures, heavy metals, pollution, and high irradiance has been studied in Arabidopsis thaliana. Ultra-weak photon emission (UPE) is presented as a signature reflecting the extent of the oxidation process and/or damage. It can be used to predict the physiological state and general health of plants. This study presents an overview of a potential research platform where the technique can be applied. The results presented can aid in providing invaluable information for developing strategies to mitigate abiotic stress in crops by improving plant breeding programs with a focus on enhancing tolerance. This study evaluates the applicability of charged couple device (CCD) imaging in evaluating plant stress and degree of damage and to discuss the advantages and limitations of the claimed non-invasive label-free tool.
人们已经在拟南芥中研究了盐度、干旱、极端温度、重金属、污染和高辐照度等非生物胁迫因素诱导的氧化损伤。超微弱光子发射（UPE）被视为反映氧化过程和/或损伤程度的一个标志。它可用于预测植物的生理状态和整体健康状况。本研究概述了一个可应用该技术的潜在研究平台。所呈现的结果有助于通过改进以增强耐受性为重点的植物育种计划，为制定减轻作物非生物胁迫的策略提供宝贵信息。本研究评估了电荷耦合器件（CCD）成像在评估植物胁迫和损伤程度方面的适用性，并讨论了这种声称的非侵入性无标记工具的优点和局限性。
