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具有高响应度和快速响应时间的石墨烯/PtSe/超薄SiO/Si宽带光电探测器。

Graphene/PtSe/Ultra-Thin SiO/Si Broadband Photodetector with Large Responsivity and Fast Response Time.

作者信息

Zhu Qing-Hai, Chai Jian, Wei Shi-Yu, Sun Jia-Bao, Sun Yi-Jun, Kiriya Daisuke, Xu Ming-Sheng

机构信息

College of Integrated Circuits, State Key Laboratory of Silicon and Advanced Semiconductor Materials, and Zhejiang Key Laboratory of Advanced Micro-Nano Transducers Technology, Zhejiang University, Hangzhou 310027, China.

College of Information Science & Electronic Engineering, Zhejiang University, 38 Zheda Road, Hangzhou 310027, China.

出版信息

Nanomaterials (Basel). 2025 Mar 29;15(7):519. doi: 10.3390/nano15070519.

Abstract

Burgeoning two-dimensional (2D) materials provide more opportunities to overcome the shortcomings of silicon-based photodetectors. However, the inevitable carrier loss in the 2D material/Si heterojunction has seriously hindered further improvement in responsivity and detection speed. Here, we propose a graphene/PtSe/ultra-thin SiO/Si photodetector (PD) with multiple optimization mechanisms. Due to the fact that photo-generated carriers can travel in the graphene plane toward the Au electrode, the introduction of a top graphene contact with low sheet resistance provides a carrier collection path in the vertical direction and further restricts the carrier recombination behavior at the lateral grain boundary of PtSe film. The ultra-thin SiO passivation layer reduces the defects at the PtSe/Si heterojunction interface. As compared to the counterpart device without the graphene top contact, the responsivity, specific detectivity, and response speed of graphene/PtSe/ultra-thin SiO/Si PD under 808 nm illumination are improved to 0.572 A/W, 1.50 × 10 Jones, and 17.3/38.8 µs, respectively. The device can detect broad-spectrum optical signals as measured from 375 nm to 1550 nm under zero bias. The PD line array with 16-pixel units shows good near-infrared imaging ability at room temperature. Our study will provide guiding significance for how to improve the comprehensive properties of PDs based on 2D/Si heterostructure for practical applications.

摘要

新兴的二维(2D)材料为克服硅基光电探测器的缺点提供了更多机会。然而,二维材料/硅异质结中不可避免的载流子损失严重阻碍了响应度和探测速度的进一步提高。在此,我们提出了一种具有多种优化机制的石墨烯/PtSe/超薄SiO/Si光电探测器(PD)。由于光生载流子可以在石墨烯平面内朝着金电极移动,引入具有低薄层电阻的顶部石墨烯接触在垂直方向上提供了载流子收集路径,并进一步限制了PtSe薄膜横向晶界处的载流子复合行为。超薄SiO钝化层减少了PtSe/Si异质结界面处的缺陷。与没有石墨烯顶部接触的对应器件相比,石墨烯/PtSe/超薄SiO/Si PD在808 nm光照下的响应度、比探测率和响应速度分别提高到了0.572 A/W、1.50×10琼斯和17.3/38.8 µs。该器件在零偏压下能够检测从375 nm到1550 nm的广谱光信号。具有16像素单元的PD线阵列在室温下显示出良好的近红外成像能力。我们的研究将为如何改善基于二维/硅异质结构的PD的综合性能以用于实际应用提供指导意义。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/483a/11990209/0f0274f8a9a0/nanomaterials-15-00519-g001.jpg

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