Musiiwa Peter Bukelani, Akashe Shyam, Upadhyay Govind Murari, Sharma Sanjay
Department of Electronic Engineering, Harare Institute of Technology, Harare, Zimbabwe.
ECED, ITM University, Gwalior, India.
Sci Rep. 2025 May 2;15(1):15433. doi: 10.1038/s41598-025-00056-9.
Sense amplifiers have of late become an important class of circuits due the major role they play in the design of low voltage memory design. It is an active circuit capable to enhance signal promulgation from the selected cell in a memory array to peripheral logic circuits and changes the random logic levels on a bit-line to the digital logic levels of the Boolean circuits in the periphery. In this paper the memristor loaded cross-coupled differential voltage sense amplifier is proposed as a possible surrogate for CMOS based cross coupled differential amplifier to reduce the area size, increase the gain and the speed of operation. With the exponential increase in the memory array sizes the bit line capacitance and cell-access resistance has become very large and this merger conjoined with the further reduction in output energy produced by the cell during reading will aggregate in the generation of a small signals from each selected cell. These small signals will make it difficult for data value detection and determination and will cause a prolonged latency times. To enhance performance speed and to provide signals that can be properly read as logic 0/1 many sense amplifiers have been designed to give faster sensing by responding to low voltage swings. To improve the gain of the sense amplifier by increasing the load resistance the memristor cells is in cooperated in amplifier. The memristor was selected as it propound reduced leakage current, populate less space area and because of quantization of conductance using memristive state allows for easy adjustability of the sense amplifier. The proposed memristor loaded sense amplifier was compared to the conventional CMOS based cross-coupled sense amplifier.
由于读出放大器在低电压存储器设计中发挥着重要作用,近年来它已成为一类重要的电路。它是一种有源电路,能够增强从存储阵列中选定单元到外围逻辑电路的信号传输,并将位线上的随机逻辑电平转换为外围布尔电路的数字逻辑电平。本文提出了忆阻器负载交叉耦合差分电压读出放大器,作为基于CMOS的交叉耦合差分放大器的一种可能替代方案,以减小面积尺寸、提高增益和操作速度。随着存储阵列尺寸的指数级增长,位线电容和单元访问电阻变得非常大,再加上读取期间单元产生的输出能量进一步降低,这将导致每个选定单元产生的信号很小。这些小信号将使数据值检测和确定变得困难,并会导致较长的延迟时间。为了提高性能速度并提供能够正确读取为逻辑0/1的信号,已经设计了许多读出放大器,通过响应低电压摆幅来实现更快的传感。为了通过增加负载电阻来提高读出放大器的增益,在放大器中引入了忆阻器单元。选择忆阻器是因为它具有降低的漏电流、占用更少的空间面积,并且由于使用忆阻状态对电导进行量化,使得读出放大器易于调节。将所提出的忆阻器负载读出放大器与传统的基于CMOS的交叉耦合读出放大器进行了比较。