Optical Properties of GePb Alloy Realized by Ion Beam Technology.

Incorporating lead (Pb) into the germanium (Ge) lattice emerges as a promising approach for bandgap engineering, enabling luminescence at longer wavelengths and paving the way for enhanced applications in short-wave infrared (SWIR) light sources and photodetectors. In this work, we report on optical properties of GePb alloys fabricated by a complementary metal-oxide semiconductor (CMOS)-compatible process that includes Pb ion implantation followed by solid-phase epitaxial regrowth via flash-lamp annealing. Optical characterization, including photoluminescence spectroscopy and Fourier-transform infrared reflectance spectroscopy, reveals that GePb alloys exhibit a reduced bandgap compared to pure Ge, resulting in longer-wavelength emission, while also providing broadband antireflective properties below 1800 nm wavelengths due to the surface subwavelength nanostructure. These findings position nanostructured GePb as a highly promising candidate for SWIR optoelectronic applications.