Department of Applied Physics, The Benin School of Engineering and Computer Science, The Center for Nanoscience and Nanotechnology, The Hebrew University of Jerusalem, Jerusalem, 91904, Israel.
Nano Lett. 2011 Jun 8;11(6):2219-24. doi: 10.1021/nl200187v. Epub 2011 May 23.
We experimentally demonstrate an on-chip nanoscale silicon surface-plasmon Schottky photodetector based on internal photoemission process and operating at telecom wavelengths. The device is fabricated using a self-aligned approach of local-oxidation of silicon (LOCOS) on silicon on insulator substrate, which provides compatibility with standard complementary metal-oxide semiconductor technology and enables the realization of the photodetector and low-loss bus photonic waveguide at the same fabrication step. Additionally, LOCOS technique allows avoiding lateral misalignment between the silicon surface and the metal layer to form a nanoscale Schottky contact. The fabricated devices showed enhanced detection capability for shorter wavelengths that is attributed to increased probability of the internal photoemission process. We found the responsivity of the nanodetector to be 0.25 and 13.3 mA/W for incident optical wavelengths of 1.55 and 1.31 μm, respectively. The presented device can be integrated with other nanophotonic and nanoplasmonic structures for the realization of monolithic opto-electronic circuitry on-chip.
我们通过实验演示了一种基于内光发射过程并在电信波长下工作的片上纳米硅表面等离子体肖特基光电探测器。该器件采用硅上绝缘体衬底上的局部氧化硅(LOCOS)的自对准方法制造,这与标准互补金属氧化物半导体技术兼容,并能够在同一制造步骤中实现光电探测器和低损耗总线光子波导。此外,LOCOS 技术允许避免硅表面和金属层之间的横向失准,从而形成纳米级肖特基接触。所制造的器件在较短波长下表现出增强的检测能力,这归因于内部光发射过程的概率增加。我们发现,对于入射光波长为 1.55 和 1.31 μm 的情况,纳米探测器的响应率分别为 0.25 和 13.3 mA/W。所提出的器件可以与其他纳米光子学和纳米等离子体结构集成,以实现片上单片光电电路。