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不同温度下CeO₂纳米颗粒的介电性能

Dielectrical Properties of CeO2 Nanoparticles at Different Temperatures.

作者信息

Zamiri Reza, Ahangar Hossein Abbastabar, Kaushal Ajay, Zakaria Azmi, Zamiri Golnoosh, Tobaldi David, Ferreira J M F

机构信息

Department of Physics, Faculty of Science, Universiti Putra Malaysia, 43400 UPM Serdang, Selangor, Malaysia; Department Materials and Ceramic Engineering (DEMaC), CICECO, University of Aveiro, Campus Santiago, 3810-193, Aveiro, Portugal.

Department of Chemistry, Faculty of Science, Islamic Azad University, Najafabad Branch, Najafabad, Isfahan, Iran.

出版信息

PLoS One. 2015 Apr 24;10(4):e0122989. doi: 10.1371/journal.pone.0122989. eCollection 2015.

Abstract

A template-free precipitation method was used as a simple and low cost method for preparation of CeO2 nanoparticles. The structure and morphology of the prepared nanoparticle samples were studied in detail using X-ray diffraction, Raman spectroscopy and Scanning Electron Microscopy (SEM) measurements. The whole powder pattern modelling (WPPM) method was applied on XRD data to accurately measure the crystalline domain size and their size distribution. The average crystalline domain diameter was found to be 5.2 nm, with a very narrow size distribution. UV-visible absorbance spectrum was used to calculate the optical energy band gap of the prepared CeO2 nanoparticles. The FT-IR spectrum of prepared CeO2 nanoparticles showed absorption bands at 400 cm(-1) to 450 cm(-1) regime, which correspond to CeO2 stretching vibration. The dielectric constant (εr) and dielectric loss (tan δ) values of sintered CeO2 compact consolidated from prepared nanoparticles were measured at different temperatures in the range from 298 K (room temperature) to 623 K, and at different frequencies from 1 kHz to 1 MHz.

摘要

一种无模板沉淀法被用作制备二氧化铈纳米颗粒的简单且低成本的方法。使用X射线衍射、拉曼光谱和扫描电子显微镜(SEM)测量对制备的纳米颗粒样品的结构和形态进行了详细研究。将全粉末图案建模(WPPM)方法应用于XRD数据,以准确测量晶畴尺寸及其尺寸分布。发现平均晶畴直径为5.2nm,尺寸分布非常窄。利用紫外可见吸收光谱计算制备的二氧化铈纳米颗粒的光学带隙。制备的二氧化铈纳米颗粒的FT-IR光谱在400cm(-1)至450cm(-1)范围内显示出吸收带,这对应于CeO2的伸缩振动。在298K(室温)至623K的不同温度以及1kHz至1MHz的不同频率下,测量了由制备的纳米颗粒烧结而成的CeO2压块的介电常数(εr)和介电损耗(tanδ)值。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/2c3b/4409379/3182fd2fa395/pone.0122989.g001.jpg

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