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基于软材料双转移印刷技术的纺织物、纸张、木材、石材和乙烯基上的非平面纳米尺度鳍式场效应晶体管

Nonplanar Nanoscale Fin Field Effect Transistors on Textile, Paper, Wood, Stone, and Vinyl via Soft Material-Enabled Double-Transfer Printing.

机构信息

†Integrated Nanotechnology Lab, King Abdullah University of Science and Technology, Thuwal 23955-6900, Saudi Arabia.

‡The KAUST Schools, King Abdullah University of Science and Technology, Thuwal 23955-6900, Saudi Arabia.

出版信息

ACS Nano. 2015 May 26;9(5):5255-63. doi: 10.1021/acsnano.5b00686. Epub 2015 May 5.

Abstract

The ability to incorporate rigid but high-performance nanoscale nonplanar complementary metal-oxide semiconductor (CMOS) electronics with curvilinear, irregular, or asymmetric shapes and surfaces is an arduous but timely challenge in enabling the production of wearable electronics with an in situ information-processing ability in the digital world. Therefore, we are demonstrating a soft-material enabled double-transfer-based process to integrate flexible, silicon-based, nanoscale, nonplanar, fin-shaped field effect transistors (FinFETs) and planar metal-oxide-semiconductor field effect transistors (MOSFETs) on various asymmetric surfaces to study their compatibility and enhanced applicability in various emerging fields. FinFET devices feature sub-20 nm dimensions and state-of-the-art, high-κ/metal gate stacks, showing no performance alteration after the transfer process. A further analysis of the transferred MOSFET devices, featuring 1 μm gate length, exhibits an ION value of nearly 70 μA/μm (VDS = 2 V, VGS = 2 V) and a low subthreshold swing of around 90 mV/dec, proving that a soft interfacial material can act both as a strong adhesion/interposing layer between devices and final substrate as well as a means to reduce strain, which ultimately helps maintain the device's performance with insignificant deterioration even at a high bending state.

摘要

将刚性但高性能的纳米级非平面互补金属氧化物半导体 (CMOS) 电子器件与曲线、不规则或不对称形状和表面集成的能力是一项艰巨但及时的挑战,因为它能够实现具有现场信息处理能力的可穿戴电子产品在数字世界中的生产。因此,我们展示了一种基于软材料的双转移工艺,将灵活的基于硅的纳米级非平面鳍式场效应晶体管 (FinFET) 和平面金属氧化物半导体场效应晶体管 (MOSFET) 集成到各种不对称表面上,以研究它们在各种新兴领域的兼容性和增强适用性。FinFET 器件具有小于 20nm 的尺寸和最先进的高κ/金属栅极堆叠,在转移过程后没有性能变化。进一步分析具有 1μm 栅长的转移 MOSFET 器件,其 ION 值接近 70μA/μm(VDS=2V,VGS=2V),亚阈值摆幅低至约 90mV/dec,证明软界面材料不仅可以充当器件和最终衬底之间的强粘附/介电层,还可以减轻应变,这最终有助于在高弯曲状态下保持器件性能,几乎没有恶化。

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