McCreary Kathleen M, Hanbicki Aubrey T, Jernigan Glenn G, Culbertson James C, Jonker Berend T
Naval Research Laboratory, Washington DC 20375, USA.
Sci Rep. 2016 Jan 13;6:19159. doi: 10.1038/srep19159.
Monolayer WS2 offers great promise for use in optical devices due to its direct bandgap and high photoluminescence intensity. While fundamental investigations can be performed on exfoliated material, large-area and high quality materials are essential for implementation of technological applications. In this work, we synthesize monolayer WS2 under various controlled conditions and characterize the films using photoluminescence, Raman and x-ray photoelectron spectroscopies. We demonstrate that the introduction of hydrogen to the argon carrier gas dramatically improves the optical quality and increases the growth area of WS2, resulting in films exhibiting mm(2) coverage. The addition of hydrogen more effectively reduces the WO3 precursor and protects against oxidative etching of the synthesized monolayers. The stoichiometric WS2 monolayers synthesized using Ar + H2 carrier gas exhibit superior optical characteristics, with photoluminescence emission full width half maximum (FWHM) values below 40 meV and emission intensities nearly an order of magnitude higher than films synthesized in a pure Ar environment.
单层二硫化钨因其直接带隙和高光致发光强度,在光学器件应用方面极具潜力。虽然可以对剥离的材料进行基础研究,但对于技术应用的实现而言,大面积且高质量的材料至关重要。在这项工作中,我们在各种可控条件下合成了单层二硫化钨,并使用光致发光、拉曼光谱和X射线光电子能谱对薄膜进行了表征。我们证明,向氩载气中引入氢气可显著提高光学质量并增加二硫化钨的生长面积,从而得到覆盖面积达平方毫米的薄膜。氢气的添加更有效地还原了三氧化钨前驱体,并防止合成的单层受到氧化蚀刻。使用氩气 + 氢气载气合成的化学计量比单层二硫化钨表现出优异的光学特性,其光致发光发射半高宽(FWHM)值低于40毫电子伏特,发射强度比在纯氩环境中合成的薄膜高出近一个数量级。