Cai Wensi, Ma Xiaochen, Zhang Jiawei, Song Aimin
School of Electrical and Electronic Engineering, University of Manchester, Manchester M13 9PL, UK.
Materials (Basel). 2017 Apr 20;10(4):429. doi: 10.3390/ma10040429.
Electric-double-layer (EDL) thin-film transistors (TFTs) have attracted much attention due to their low operation voltages. Recently, EDL TFTs gated with radio frequency (RF) magnetron sputtered SiO₂ have been developed which is compatible to large-area electronics fabrication. In this work, fully transparent Indium-Gallium-Zinc-Oxide-based EDL TFTs on glass substrates have been fabricated at room temperature for the first time. A maximum transmittance of about 80% has been achieved in the visible light range. The transparent TFTs show a low operation voltage of 1.5 V due to the large EDL capacitance (0.3 µF/cm² at 20 Hz). The devices exhibit a good performance with a low subthreshold swing of 130 mV/dec and a high on-off ratio > 10⁵. Several tests have also been done to investigate the influences of light irradiation and bias stress. Our results suggest that such transistors might have potential applications in battery-powered transparent electron devices.
由于其低工作电压,双电层(EDL)薄膜晶体管(TFT)已引起广泛关注。最近,已开发出采用射频(RF)磁控溅射SiO₂栅极的EDL TFT,其与大面积电子制造兼容。在这项工作中,首次在室温下在玻璃基板上制造了基于铟镓锌氧化物的全透明EDL TFT。在可见光范围内实现了约80%的最大透过率。由于大的EDL电容(20 Hz时为0.3 μF/cm²),透明TFT显示出1.5 V的低工作电压。这些器件表现出良好的性能,具有130 mV/dec的低亚阈值摆幅和大于10⁵的高开关比。还进行了几项测试以研究光照射和偏置应力的影响。我们的结果表明,此类晶体管可能在电池供电的透明电子器件中具有潜在应用。