Cong Ridong, Qiao Shuang, Liu Jihong, Mi Jiansong, Yu Wei, Liang Baolai, Fu Guangsheng, Pan Caofeng, Wang Shufang
Hebei Key Laboratory of Optic-Electronic Information and Materials College of Physics Science and Technology Hebei University Baoding 071002 P. R. China.
Beijing Institute of Nanoenergy and Nanosystems Chinese Academy of Sciences Beijing 100083 China.
Adv Sci (Weinh). 2017 Dec 1;5(2):1700502. doi: 10.1002/advs.201700502. eCollection 2018 Feb.
MoS, as a typical transition metal dichalcogenide, has attracted great interest because of its distinctive electronic, optical, and catalytic properties. However, its advantages of strong light absorption and fast intralayer mobility cannot be well developed in the usual reported monolayer/few-layer structures, which make the performances of MoS-based devices undesirable. Here, large-area, high-quality, and vertically oriented few-layer MoS (V-MoS) nanosheets are prepared by chemical vapor deposition and successfully transferred onto an Si substrate to form the V-MoS/Si heterojunction. Because of the strong light absorption and the fast carrier transport speed of the V-MoS nanosheets, as well as the strong built-in electric field at the interface of V-MoS and Si, lateral photovoltaic effect (LPE) measurements suggest that the V-MoS/Si heterojunction is a self-powered, high-performance position sensitive detector (PSD). The PSD demonstrates ultrahigh position sensitivity over a wide spectrum, ranging from 350 to 1100 nm, with position sensitivity up to 401.1 mV mm, and shows an ultrafast response speed of 16 ns with excellent stability and reproducibility. Moreover, considering the special carrier transport process in LPE, for the first time, the intralayer and the interlayer transport times in V-MoS are obtained experimentally as 5 and 11 ns, respectively.
作为一种典型的过渡金属二硫属化物,二硫化钼(MoS)因其独特的电子、光学和催化性能而备受关注。然而,在通常报道的单层/少层结构中,其强光吸收和快速层内迁移率的优势无法得到充分发挥,这使得基于MoS的器件性能不尽人意。在此,通过化学气相沉积法制备了大面积、高质量且垂直取向的少层MoS(V-MoS)纳米片,并成功转移到硅衬底上形成V-MoS/硅异质结。由于V-MoS纳米片具有强光吸收和快速载流子传输速度,以及V-MoS与硅界面处强大的内建电场,横向光伏效应(LPE)测量表明,V-MoS/硅异质结是一种自供电的高性能位置敏感探测器(PSD)。该PSD在350至1100 nm的宽光谱范围内表现出超高的位置灵敏度,位置灵敏度高达401.1 mV/mm,并具有16 ns的超快响应速度,稳定性和再现性极佳。此外,考虑到LPE中特殊的载流子传输过程,首次通过实验测得V-MoS中的层内传输时间和层间传输时间分别为5 ns和11 ns。