Global QTL Analysis Identifies Genomic Regions on Chromosomes 4A and 4B Harboring Stable Loci for Yield-Related Traits Across Different Environments in Wheat ( L.).

Major advances in wheat production are needed to address global food insecurity under future climate conditions, such as high temperatures. The grain yield of bread wheat ( L.) is a quantitatively inherited complex trait that is strongly influenced by interacting genetic and environmental factors. Here, we conducted global QTL analysis for five yield-related traits, including spike yield, yield components and plant height (PH), in the Nongda3338/Jingdong6 doubled haploid (DH) population using a high-density SNP and SSR-based genetic map. A total of 12 major genomic regions with stable QTL controlling yield-related traits were detected on chromosomes 1B, 2A, 2B, 2D, 3A, 4A, 4B, 4D, 5A, 6A, and 7A across 12 different field trials with timely sown (normal) and late sown (heat stress) conditions. Co-location of yield components revealed significant tradeoffs between thousand grain weight (TGW) and grain number per spike (GNS) on chromosome 4A. Dissection of a "QTL-hotspot" region for grain weight on chromosome 4B was helpful in marker-assisted selection (MAS) breeding. Moreover, this study identified a novel QTL for heat susceptibility index of thousand grain weight (HSITGW) on chromosome 4BL that explains approximately 10% of phenotypic variation. and were coincident with the dwarfing genes , and , and haplotype analysis revealed their pleiotropic architecture with yield components. Overall, our findings will be useful for elucidating the genetic architecture of yield-related traits and developing new wheat varieties with high and stable yield.