Lin Yu-Ting, Zhang Xin-Quan, Chen Po-Han, Chi Chong-Chi, Lin Erh-Chen, Rong Jian-Guo, Ouyang Chuenhou, Chen Yung-Fu, Lee Yi-Hsien
Department of Physics, National Central University, Zhongli, Taoyuan, 32001, Taiwan.
Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu, 30013, Taiwan.
Nanoscale Res Lett. 2020 Mar 12;15(1):61. doi: 10.1186/s11671-020-3261-y.
Nanoelectronics of two-dimensional (2D) materials and related applications are hindered with critical contact issues with the semiconducting monolayers. To solve these issues, a fundamental challenge is selective and controllable fabrication of p-type or ambipolar transistors with a low Schottky barrier. Most p-type transistors are demonstrated with tungsten selenides (WSe) but a high growth temperature is required. Here, we utilize seeding promoter and low pressure CVD process to enhance sequential WSe growth with a reduced growth temperature of 800 °C for reduced compositional fluctuations and high hetero-interface quality. Growth behavior of the sequential WSe growth at the edge of patterned graphene is discussed. With optimized growth conditions, high-quality interface of the laterally stitched WSe-graphene is achieved and characterized with transmission electron microscopy (TEM). Device fabrication and electronic performances of the laterally stitched WSe-graphene are presented.
二维(2D)材料的纳米电子学及其相关应用受到与半导体单层的关键接触问题的阻碍。为了解决这些问题,一个基本挑战是选择性和可控地制造具有低肖特基势垒的p型或双极晶体管。大多数p型晶体管是用硒化钨(WSe)展示的,但需要较高的生长温度。在这里,我们利用种子促进剂和低压化学气相沉积工艺来增强WSe的顺序生长,将生长温度降低到800°C,以减少成分波动并提高异质界面质量。讨论了图案化石墨烯边缘处WSe顺序生长的生长行为。通过优化生长条件,实现了横向拼接的WSe-石墨烯的高质量界面,并用透射电子显微镜(TEM)进行了表征。展示了横向拼接的WSe-石墨烯的器件制造和电子性能。