Huang Wei, Chien Po-Hsiu, McMillen Kyle, Patel Sawankumar, Tedesco Joshua, Zeng Li, Mukherjee Subhrangsu, Wang Binghao, Chen Yao, Wang Gang, Wang Yang, Gao Yanshan, Bedzyk Michael J, DeLongchamp Dean M, Hu Yan-Yan, Medvedeva Julia E, Marks Tobin J, Facchetti Antonio
Department of Chemistry, Northwestern University, Evanston, IL 60208.
Materials Research Center, Northwestern University, Evanston, IL 60208.
Proc Natl Acad Sci U S A. 2020 Aug 4;117(31):18231-18239. doi: 10.1073/pnas.2007897117. Epub 2020 Jul 23.
The field-effect electron mobility of aqueous solution-processed indium gallium oxide (IGO) thin-film transistors (TFTs) is significantly enhanced by polyvinyl alcohol (PVA) addition to the precursor solution, a >70-fold increase to 7.9 cm/Vs. To understand the origin of this remarkable phenomenon, microstructure, electronic structure, and charge transport of IGO:PVA film are investigated by a battery of experimental and theoretical techniques, including In K-edge and Ga K-edge extended X-ray absorption fine structure (EXAFS); resonant soft X-ray scattering (R-SoXS); ultraviolet photoelectron spectroscopy (UPS); Fourier transform-infrared (FT-IR) spectroscopy; time-of-flight secondary-ion mass spectrometry (ToF-SIMS); composition-/processing-dependent TFT properties; high-resolution solid-state H, Ga, and In NMR spectroscopy; and discrete Fourier transform (DFT) analysis with ab initio molecular dynamics (MD) liquid-quench simulations. The Ga{H} rotational-echo double-resonance (REDOR) NMR and other data indicate that PVA achieves optimal H doping with a Ga···H distance of ∼3.4 Å and conversion from six- to four-coordinate Ga, which together suppress deep trap defect localization. This reduces metal-oxide polyhedral distortion, thereby increasing the electron mobility. Hydroxyl polymer doping thus offers a pathway for efficient H doping in green solvent-processed metal oxide films and the promise of high-performance, ultra-stable metal oxide semiconductor electronics with simple binary compositions.
通过向前驱体溶液中添加聚乙烯醇(PVA),水溶液处理的氧化铟镓(IGO)薄膜晶体管(TFT)的场效应电子迁移率显著提高,提高了70倍以上,达到7.9 cm²/V·s。为了理解这一显著现象的起源,通过一系列实验和理论技术研究了IGO:PVA薄膜的微观结构、电子结构和电荷传输,包括In K边和Ga K边扩展X射线吸收精细结构(EXAFS);共振软X射线散射(R-SoXS);紫外光电子能谱(UPS);傅里叶变换红外(FT-IR)光谱;飞行时间二次离子质谱(ToF-SIMS);与成分/处理相关的TFT特性;高分辨率固态H、Ga和In NMR光谱;以及从头算分子动力学(MD)液体淬火模拟的离散傅里叶变换(DFT)分析。Ga{H}旋转回波双共振(REDOR)NMR和其他数据表明,PVA实现了最佳的H掺杂,Ga···H距离约为3.4 Å,并且从六配位Ga转变为四配位Ga,这共同抑制了深陷阱缺陷的定位。这减少了金属氧化物多面体的畸变,从而提高了电子迁移率。因此,羟基聚合物掺杂为绿色溶剂处理的金属氧化物薄膜中的高效H掺杂提供了一条途径,并有望实现具有简单二元组成的高性能、超稳定金属氧化物半导体电子器件。