Chang Yun-Yeong, Han Heung Nam, Kim Miyoung
Department of Materials Science and Engineering, Seoul National University, Seoul, 151-744, Korea.
Appl Microsc. 2019 Nov 4;49(1):10. doi: 10.1186/s42649-019-0013-5.
Two-dimensional materials such as transition metal dichalcogenide and graphene are of great interest due to their intriguing electronic and optical properties such as metal-insulator transition based on structural variation. Accordingly, detailed analyses of structural tunability with transmission electron microscopy have become increasingly important for understanding atomic configurations. This review presents a few analyses that can be applied to two-dimensional materials using transmission electron microscopy.
诸如过渡金属二卤化物和石墨烯之类的二维材料因其基于结构变化的有趣电子和光学特性（如金属-绝缘体转变）而备受关注。因此，利用透射电子显微镜对结构可调性进行详细分析对于理解原子构型变得越来越重要。本综述介绍了一些可利用透射电子显微镜应用于二维材料的分析方法。
