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基于硅纳米线反馈场效应晶体管的逻辑存内反相器的设计与仿真

Design and Simulation of Logic-In-Memory Inverter Based on a Silicon Nanowire Feedback Field-Effect Transistor.

作者信息

Baek Eunwoo, Son Jaemin, Cho Kyoungah, Kim Sangsig

机构信息

Department of Semiconductor Systems Engineering, Korea University, 145 Anam-ro, Seoul 02841, Korea.

Department of Electrical Engineering, Korea University, 145 Anam-ro, Seoul 02841, Korea.

出版信息

Micromachines (Basel). 2022 Apr 9;13(4):590. doi: 10.3390/mi13040590.

DOI:10.3390/mi13040590
PMID:35457895
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC9028487/
Abstract

In this paper, we propose a logic-in-memory (LIM) inverter comprising a silicon nanowire (SiNW) n-channel feedback field-effect transistor (n-FBFET) and a SiNW p-channel metal oxide semiconductor field-effect transistor (p-MOSFET). The hybrid logic and memory operations of the LIM inverter were investigated by mixed-mode technology computer-aided design simulations. Our LIM inverter exhibited a high voltage gain of 296.8 (/) when transitioning from logic '1' to '0' and 7.9 (/) when transitioning from logic '0' to '1', while holding calculated logic at zero input voltage. The energy band diagrams of the n-FBFET structure demonstrated that the holding operation of the inverter was implemented by controlling the positive feedback loop. Moreover, the output logic can remain constant without any supply voltage, resulting in zero static power consumption.

摘要

在本文中,我们提出了一种内存逻辑(LIM)反相器,它由一根硅纳米线(SiNW)n沟道反馈场效应晶体管(n-FBFET)和一根SiNW p沟道金属氧化物半导体场效应晶体管(p-MOSFET)组成。通过混合模式技术计算机辅助设计模拟研究了LIM反相器的混合逻辑和存储操作。我们的LIM反相器在从逻辑“1”转换为“0”时表现出296.8(/)的高电压增益,在从逻辑“0”转换为“1”时表现出7.9(/)的高电压增益,同时在零输入电压下保持计算出的逻辑。n-FBFET结构的能带图表明,反相器的保持操作是通过控制正反馈回路来实现的。此外,输出逻辑可以在没有任何电源电压的情况下保持恒定,从而实现零静态功耗。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/51e4/9028487/2ff9fe4fd1d6/micromachines-13-00590-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/51e4/9028487/09da4fdcc281/micromachines-13-00590-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/51e4/9028487/60c45f2fb667/micromachines-13-00590-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/51e4/9028487/f68e47ffde37/micromachines-13-00590-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/51e4/9028487/72fc6c7d06c7/micromachines-13-00590-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/51e4/9028487/dc7663b50beb/micromachines-13-00590-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/51e4/9028487/4c6674b664aa/micromachines-13-00590-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/51e4/9028487/2ff9fe4fd1d6/micromachines-13-00590-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/51e4/9028487/09da4fdcc281/micromachines-13-00590-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/51e4/9028487/60c45f2fb667/micromachines-13-00590-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/51e4/9028487/f68e47ffde37/micromachines-13-00590-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/51e4/9028487/72fc6c7d06c7/micromachines-13-00590-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/51e4/9028487/dc7663b50beb/micromachines-13-00590-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/51e4/9028487/4c6674b664aa/micromachines-13-00590-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/51e4/9028487/2ff9fe4fd1d6/micromachines-13-00590-g007.jpg

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本文引用的文献

1
Simulation studies on electrical characteristics of silicon nanowire feedback field-effect transistors with interface trap charges.具有界面陷阱电荷的硅纳米线反馈场效应晶体管电学特性的模拟研究
Sci Rep. 2021 Sep 20;11(1):18650. doi: 10.1038/s41598-021-98182-7.
2
New Logic-In-Memory Paradigms: An Architectural and Technological Perspective.新型内存逻辑范式:架构与技术视角
Micromachines (Basel). 2019 May 31;10(6):368. doi: 10.3390/mi10060368.
3
Steep Subthreshold Swing n- and p-Channel Operation of Bendable Feedback Field-Effect Transistors with p(+)-i-n(+) Nanowires by Dual-Top-Gate Voltage Modulation.
双栅压调制的 p(+)-i-n(+) 纳米线可弯曲反馈场效应晶体管的亚阈值摆幅陡 n 沟道和 p 沟道工作。
Nano Lett. 2015 Aug 12;15(8):4905-13. doi: 10.1021/acs.nanolett.5b00606. Epub 2015 Jul 31.
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Memory leads the way to better computing.内存引领通往更好计算的道路。
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Ferroelectric nonvolatile nanowire memory circuit using a single ZnO nanowire and copolymer top layer.使用单个氧化锌纳米线和共聚物顶层的铁电非易失性纳米线存储电路。
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