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全基因组关联分析栽培二粒小麦叶锈病抗性。

Genome-wide association analyses of leaf rust resistance in cultivated emmer wheat.

机构信息

USDA-ARS, Crop Improvement and Genetics Research Unit, Western Regional Research Center, Albany, CA, 94710, USA.

Department of Plant Sciences, North Dakota State University, Fargo, ND, 58108, USA.

出版信息

Theor Appl Genet. 2023 Jan;136(1):20. doi: 10.1007/s00122-023-04281-6. Epub 2023 Jan 22.

DOI:10.1007/s00122-023-04281-6
PMID:36683081
Abstract

Fifteen and eleven loci, with most loci being novel, were identified to associate with seedling and adult resistances, respectively, to the durum-specific races of leaf rust pathogen in cultivated emmer. Leaf rust, caused by Puccinia triticina (Pt), constantly threatens durum (Triticum turgidum ssp. durum) and bread wheat (Triticum aestivum) production worldwide. A Pt race BBBQD detected in California in 2009 poses a potential threat to durum production in North America because resistance source to this race is rare in durum germplasm. To find new resistance sources, we assessed a panel of 180 cultivated emmer wheat (Triticum turgidum ssp. dicoccum) accessions for seedling resistance to BBBQD and for adult resistance to a mixture of durum-specific races BBBQJ, CCMSS, and MCDSS in the field, and genotyped the panel using genotype-by-sequencing (GBS) and the 9 K SNP (Single Nucleotide Polymorphism) Infinium array. The results showed 24 and nine accessions consistently exhibited seedling and adult resistance, respectively, with two accessions providing resistance at both stages. We performed genome-wide association studies using 46,383 GBS and 4,331 9 K SNP markers and identified 15 quantitative trait loci (QTL) for seedling resistance located mostly on chromosomes 2B and 6B, and 11 QTL for adult resistance on 2B, 3B and 6A. Of these QTL, one might be associated with leaf rust resistance (Lr) gene Lr53, and two with the QTL previously reported in durum or hexaploid wheat. The remaining QTL are potentially associated with new Lr genes. Further linkage analysis and gene cloning are necessary to identify the causal genes underlying these QTL. The emmer accessions with high levels of resistance will be useful for developing mapping populations and adapted durum germplasm and varieties with resistance to the durum-specific races.

摘要

在栽培六倍体硬粒小麦中,鉴定到分别与幼苗和成株抗叶锈病(由 Puccinia triticina 引起)的 15 个和 11 个基因座,大多数基因座是新的。叶锈病不断威胁着硬粒小麦(Triticum turgidum ssp. durum)和普通小麦(Triticum aestivum)在全球的生产。2009 年在加利福尼亚州发现的叶锈病 BBBQD 菌株对北美硬粒小麦生产构成潜在威胁,因为这种菌株在硬粒小麦种质资源中很少见。为了寻找新的抗性来源,我们评估了 180 份栽培六倍体硬粒小麦(Triticum turgidum ssp. dicoccum)对 BBBQD 的幼苗抗性和田间对硬粒小麦特异性菌株 BBBQJ、CCMSS 和 MCDSS 的成株抗性,并使用基因型测序(GBS)和 9K SNP(单核苷酸多态性)Infinium 阵列对该群体进行了基因分型。结果表明,24 份和 9 份材料分别一致表现出幼苗和成株抗性,其中 2 份材料在两个阶段均表现出抗性。我们使用 46383 个 GBS 和 4331 个 9K SNP 标记进行全基因组关联研究,鉴定到 15 个与幼苗抗性相关的数量性状基因座(QTL),主要位于 2B 和 6B 染色体上,以及 11 个与成株抗性相关的 QTL,位于 2B、3B 和 6A 染色体上。其中一个 QTL 可能与叶锈病抗性(Lr)基因 Lr53 相关,两个 QTL 与先前在硬粒小麦或六倍体小麦中报道的 QTL 相关。其余 QTL 可能与新的 Lr 基因相关。需要进一步的连锁分析和基因克隆来鉴定这些 QTL 下的候选基因。具有高水平抗性的六倍体硬粒小麦材料将有助于开发图谱群体和适应硬粒小麦特异性菌株的抗性硬粒小麦种质资源和品种。

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本文引用的文献

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Plant Genome. 2022 Mar;15(1):e20185. doi: 10.1002/tpg2.20185. Epub 2021 Dec 17.
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