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W/ZnO/ITO 存储单元的可调电阻开关行为及机制

Tunable Resistive Switching Behaviors and Mechanism of the W/ZnO/ITO Memory Cell.

作者信息

Yu Zhiqiang, Jia Jinhao, Qu Xinru, Wang Qingcheng, Kang Wenbo, Liu Baosheng, Xiao Qingquan, Gao Tinghong, Xie Quan

机构信息

Faculty of Electronic Engineering, Guangxi University of Science and Technology, Liuzhou 545006, China.

Institute of Advanced Optoelectronic Materials and Technology, College of Big Data and Information Engineering, Guizhou University, Guiyang 550025, China.

出版信息

Molecules. 2023 Jul 10;28(14):5313. doi: 10.3390/molecules28145313.

Abstract

A facile sol-gel spin coating method has been proposed for the synthesis of spin-coated ZnO nanofilms on ITO substrates. The as-prepared ZnO-nanofilm-based W/ZnO/ITO memory cell showed forming-free and tunable nonvolatile multilevel resistive switching behaviors with a high resistance ratio of about two orders of magnitude, which can be maintained for over 10 s and without evident deterioration. The tunable nonvolatile multilevel resistive switching phenomena were achieved by modulating the different set voltages of the W/ZnO/ITO memory cell. In addition, the tunable nonvolatile resistive switching behaviors of the ZnO-nanofilm-based W/ZnO/ITO memory cell can be interpreted by the partial formation and rupture of conductive nanofilaments modified by the oxygen vacancies. This work demonstrates that the ZnO-nanofilm-based W/ZnO/ITO memory cell may be a potential candidate for future high-density, nonvolatile, memory applications.

摘要

已提出一种简便的溶胶-凝胶旋涂法,用于在ITO衬底上合成旋涂ZnO纳米薄膜。所制备的基于ZnO纳米薄膜的W/ZnO/ITO存储单元表现出无形成过程且可调的非易失性多级电阻开关行为,具有约两个数量级的高电阻比,可保持超过10秒且无明显劣化。通过调制W/ZnO/ITO存储单元的不同设置电压实现了可调的非易失性多级电阻开关现象。此外,基于ZnO纳米薄膜的W/ZnO/ITO存储单元的可调非易失性电阻开关行为可通过由氧空位修饰的导电纳米丝的部分形成和断裂来解释。这项工作表明,基于ZnO纳米薄膜的W/ZnO/ITO存储单元可能是未来高密度、非易失性存储应用的潜在候选者。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/338c/10385145/f8e6c1cca5fb/molecules-28-05313-g001.jpg

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