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用于同步加速器和X射线自由电子激光源的串行晶体学的片上片固定目标数据收集装置。

Sheet-on-sheet fixed target data collection devices for serial crystallography at synchrotron and XFEL sources.

作者信息

Doak R Bruce, Shoeman Robert L, Gorel Alexander, Niziński Stanisław, Barends Thomas R M, Schlichting Ilme

机构信息

Department of Biomolecular Mechanisms Max Planck Institute for Medical Research Jahnstrasse 29 Heidelberg69120 Germany.

出版信息

J Appl Crystallogr. 2024 Oct 16;57(Pt 6):1725-1732. doi: 10.1107/S1600576724008914. eCollection 2024 Dec 1.

Abstract

Serial crystallography (SX) efficiently distributes over many crystals the radiation dose absorbed during diffraction data acquisition, enabling structure determination of samples at ambient temperature. SX relies on the rapid and reliable replacement of X-ray-exposed crystals with fresh crystals at a rate commensurate with the data acquisition rate. 'Solid supports', also known as 'fixed targets' or 'chips', offer one approach. These are microscopically thin solid panes into or onto which crystals are deposited to be individually interrogated by an X-ray beam. Solid supports are generally patterned using photolithography methods to produce a regular array of features that trap single crystals. A simpler and less expensive alternative is to merely sandwich the microcrystals between two unpatterned X-ray-transparent polymer sheets. Known as sheet-on-sheet (SOS) chips, these offer significantly more versatility. SOS chips place no constraint on the size or size distribution of the microcrystals or their growth conditions. Crystals ranging from true nanocrystals up to microcrystals can be investigated, as can crystals grown in media ranging from low viscosity (aqueous solution) up to high viscosity (such as lipidic cubic phase). Here, we describe our two SOS devices. The first is a compact and lightweight version designed specifically for synchrotron use. It incorporates a standard SPINE-type magnetic base for mounting on a conventional macromolecular crystallography goniometer. The second and larger chip is intended for both X-ray free-electron laser and synchrotron use and is fully compatible with the fast-scanning -raster stages developed for data collection with patterned chips.

摘要

串行晶体学(SX)能在衍射数据采集过程中,将吸收的辐射剂量有效地分散到许多晶体上,从而能够在环境温度下测定样品的结构。SX依赖于以与数据采集速率相称的速度,用新鲜晶体快速可靠地替换受X射线照射的晶体。“固体支撑物”,也被称为“固定靶”或“芯片”,提供了一种方法。这些是微观上很薄的固体板,晶体被沉积到其中或其上,以便通过X射线束单独进行检测。固体支撑物通常使用光刻方法进行图案化,以产生捕获单晶的规则特征阵列。一种更简单且成本更低的替代方法是,仅仅将微晶夹在两个无图案的X射线透明聚合物片之间。这些被称为片上片(SOS)芯片,具有显著更高的通用性。SOS芯片对微晶的尺寸或尺寸分布及其生长条件没有限制。从真正的纳米晶体到微晶的各种晶体都可以被研究,在从低粘度(水溶液)到高粘度(如脂质立方相)的介质中生长的晶体也可以被研究。在这里,我们描述我们的两种SOS装置。第一种是专门为同步加速器使用而设计的紧凑轻便版本。它集成了一个标准的SPINE型磁性底座,用于安装在传统的大分子晶体学测角仪上。第二种更大的芯片适用于X射线自由电子激光和同步加速器,并且与为使用图案化芯片进行数据采集而开发的快速扫描光栅台完全兼容。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/aeea/11611291/d6ca683580b8/j-57-01725-fig1.jpg

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