Pâques F, Bucheton B, Wegnez M
Laboratoire d'Embryologie Moléculaire et Expérimentale, Université Paris XI, Orsay, France.
Genetics. 1996 Feb;142(2):459-70. doi: 10.1093/genetics/142.2.459.
In a previous report we described rearrangements occurring at a high rate (30% of the progeny of dysgenic flies) within a cluster of 5S genes internal to a P element. These events were characterized as precise amplifications and deletions of 5S units. Here we analyze recombination events within P elements containing two repeated arrays of 5S genes flanking a central white gene. Deletions (50%) and duplications (3%) of the white gene together with various amounts of flanking 5S genes were observed. These recombinations occur preferentially between the most external 5S units of P transposons. Such rearrangements could be favored by interactions between the proteins bound to the P terminal sequences.
在之前的一份报告中，我们描述了在P元件内部的一个5S基因簇内以高频率（不育果蝇后代的30%）发生的重排。这些事件的特征是5S单元的精确扩增和缺失。在这里，我们分析了含有两个重复的5S基因阵列且围绕一个中央白色基因的P元件内的重组事件。观察到白色基因的缺失（50%）和重复（3%）以及不同数量的侧翼5S基因。这些重组优先发生在P转座子最外部的5S单元之间。这种重排可能受到与P末端序列结合的蛋白质之间相互作用的促进。
