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结构缺陷在基于氮化铟镓的蓝光发光二极管和激光二极管中的作用。

The roles of structural imperfections in InGaN-based blue light-emitting diodes and laser diodes.

作者信息

Nakamura S

机构信息

The author is in the Department of Research and Development, Nichia Chemical Industries, 491 Oka, Kaminaka, Anan, Tokushima 774, Japan. E-mail:

出版信息

Science. 1998 Aug 14;281(5379):955-61. doi: 10.1126/science.281.5379.956.

Abstract

REVIEW High-efficiency light-emitting diodes emitting amber, green, blue, and ultraviolet light have been obtained through the use of an InGaN active layer instead of a GaN active layer. The localized energy states caused by In composition fluctuation in the InGaN active layer are related to the high efficiency of the InGaN-based emitting devices. The blue and green InGaN quantum-well structure light-emitting diodes with luminous efficiencies of 5 and 30 lumens per watt, respectively, can be made despite the large number of threading dislocations (1 x 10(8) to 1 x 10(12) cm-2). Epitaxially laterally overgrown GaN on sapphire reduces the number of threading dislocations originating from the interface of the GaN epilayer with the sapphire substrate. InGaN multi-quantum-well structure laser diodes formed on the GaN layer above the SiO2 mask area can have a lifetime of more than 10,000 hours. Dislocations increase the threshold current density of the laser diodes.

摘要

综述 通过使用InGaN有源层而非GaN有源层,已获得了发出琥珀色、绿色、蓝色和紫外光的高效发光二极管。InGaN有源层中因In成分波动而产生的局域能态与基于InGaN的发光器件的高效率相关。尽管存在大量穿透位错(1×10⁸至1×10¹² cm⁻²),仍可制造出分别具有每瓦5流明和30流明发光效率的蓝色和绿色InGaN量子阱结构发光二极管。在蓝宝石上进行外延横向生长的GaN可减少源自GaN外延层与蓝宝石衬底界面的穿透位错数量。在SiO₂掩膜区域上方的GaN层上形成的InGaN多量子阱结构激光二极管的寿命可超过10000小时。位错会增加激光二极管的阈值电流密度。

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