Liao Junyi, Wen Wen, Wu Juanxia, Zhou Yaming, Hussain Sabir, Hu Haowen, Li Jiawei, Liaqat Adeel, Zhu Hongwei, Jiao Liying, Zheng Qiang, Xie Liming
CAS Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, Beijing 100190, P.R. China.
Department of Chemistry, Tsinghua University, Beijing 100084, P.R. China.
ACS Nano. 2023 Mar 28;17(6):6095-6102. doi: 10.1021/acsnano.3c01198. Epub 2023 Mar 13.
In-memory computing is a highly efficient approach for breaking the bottleneck of von Neumann architectures, i.e., reducing redundant latency and energy consumption during the data transfer between the physically separated memory and processing units. Herein we have designed a in-memory computing device, a van der Waals ferroelectric semiconductor (InSe) based metal-oxide-ferroelectric semiconductor field-effect transistor (MOfeS-FET). This MOfeS-FET integrates memory and logic functions in the same material, in which the out-of-plane (OOP) ferroelectric polarization in InSe is used for data storage and the semiconducting property is used for the logic computation. The MOfeS-FET shows a long retention time with high on/off ratios (>10), high program/erase (P/E) ratios (10), and stable cyclic endurance. Moreover, inverter, programmable NAND, and NOR Boolean logic operations with nonvolatile storage of the results have all been demonstrated using our approach. These findings highlight the potential of van der Waals ferroelectric semiconductor-based MOfeS-FETs in the in-memory computing and their potential of achieving size scaling beyond Moore's law.
内存计算是一种打破冯·诺依曼架构瓶颈的高效方法,即减少物理上分离的内存与处理单元之间数据传输过程中的冗余延迟和能耗。在此,我们设计了一种内存计算设备,即基于范德华铁电半导体(InSe)的金属氧化物铁电半导体场效应晶体管(MOfeS-FET)。这种MOfeS-FET在同一材料中集成了内存和逻辑功能,其中InSe中的面外(OOP)铁电极化用于数据存储,半导体特性用于逻辑计算。该MOfeS-FET具有长保持时间、高开关比(>10)、高编程/擦除(P/E)比(10)以及稳定的循环耐久性。此外,使用我们的方法已经演示了具有结果非易失性存储的反相器、可编程与非门和或非门布尔逻辑运算。这些发现突出了基于范德华铁电半导体的MOfeS-FET在内存计算中的潜力以及其实现超越摩尔定律的尺寸缩放的潜力。