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具有挥发性和非挥发性开关特性的喷墨打印铟镓锌氧化物忆阻器。

Inkjet printed IGZO memristors with volatile and non-volatile switching.

作者信息

Franco Miguel, Kiazadeh Asal, Deuermeier Jonas, Lanceros-Méndez S, Martins Rodrigo, Carlos Emanuel

机构信息

Center of Physics, University of Minho and Laboratory of Physics for Materials and Emergent Technologies, LapMET, Campus de Gualtar, 4710-057, Braga, Portugal.

CENIMAT|i3N, Department of Materials Science, School of Science and Technology, NOVA University Lisbon and CEMOP/UNINOVA, Caparica, Portugal.

出版信息

Sci Rep. 2024 Mar 29;14(1):7469. doi: 10.1038/s41598-024-58228-y.

DOI:10.1038/s41598-024-58228-y
PMID:38553556
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC10980760/
Abstract

Solution-based memristors deposited by inkjet printing technique have a strong technological potential based on their scalability, low cost, environmentally friendlier processing by being an efficient technique with minimal material waste. Indium-gallium-zinc oxide (IGZO), an oxide semiconductor material, shows promising resistive switching properties. In this work, a printed Ag/IGZO/ITO memristor has been fabricated. The IGZO thickness influences both memory window and switching voltage of the devices. The devices show both volatile counter8wise (c8w) and non-volatile 8wise (8w) switching at low operating voltage. The 8w switching has a SET and RESET voltage lower than 2 V and - 5 V, respectively, a retention up to 10 s and a memory window up to 100, whereas the c8w switching shows volatile characteristics with a low threshold voltage (Vth < - 0.65 V) and a characteristic time (τ) of 0.75 ± 0.12 ms when a single pulse of - 0.65 V with width of 0.1 ms is applied. The characteristic time alters depending on the number of pulses. These volatile characteristics allowed them to be tested on different 4-bit pulse sequences, as an initial proof of concept for temporal signal processing applications.

摘要

通过喷墨打印技术沉积的基于溶液的忆阻器,因其可扩展性、低成本、加工过程对环境更友好(是一种高效技术且材料浪费极少)而具有强大的技术潜力。铟镓锌氧化物(IGZO),一种氧化物半导体材料,展现出有前景的电阻开关特性。在这项工作中,制备了一种印刷Ag/IGZO/ITO忆阻器。IGZO的厚度会影响器件的记忆窗口和开关电压。这些器件在低工作电压下既表现出易失性逆时针(c8w)开关特性,也表现出非易失性8向(8w)开关特性。8w开关的设置电压和重置电压分别低于2 V和 -5 V,保持时间长达10 s,记忆窗口高达100,而当施加宽度为0.1 ms的 -0.65 V单脉冲时,c8w开关表现出具有低阈值电压(Vth < -0.65 V)和0.75±0.12 ms的特征时间(τ)的易失性特性。特征时间会根据脉冲数量而改变。这些易失性特性使其能够在不同的4位脉冲序列上进行测试,作为时间信号处理应用概念验证的初步证明。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1d9f/10980760/309bf3700877/41598_2024_58228_Fig6_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1d9f/10980760/7877dea8725c/41598_2024_58228_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1d9f/10980760/187d04bd21ea/41598_2024_58228_Fig2_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1d9f/10980760/9176cf49588a/41598_2024_58228_Fig3_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1d9f/10980760/e1c871ec9d91/41598_2024_58228_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1d9f/10980760/f9f2051a9034/41598_2024_58228_Fig5_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1d9f/10980760/309bf3700877/41598_2024_58228_Fig6_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1d9f/10980760/7877dea8725c/41598_2024_58228_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1d9f/10980760/187d04bd21ea/41598_2024_58228_Fig2_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1d9f/10980760/9176cf49588a/41598_2024_58228_Fig3_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1d9f/10980760/e1c871ec9d91/41598_2024_58228_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1d9f/10980760/f9f2051a9034/41598_2024_58228_Fig5_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1d9f/10980760/309bf3700877/41598_2024_58228_Fig6_HTML.jpg

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本文引用的文献

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Emergent solution based IGZO memristor towards neuromorphic applications.面向神经形态应用的基于紧急解决方案的铟镓锌氧化物忆阻器。
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Simulation platform for pattern recognition based on reservoir computing with memristor networks.
基于忆阻器网络的储层计算的模式识别仿真平台。
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