女性半导体工人受孕能力的前瞻性评估。

Prospective assessment of fecundability of female semiconductor workers.

作者信息

Eskenazi B, Gold E B, Samuels S J, Wight S, Lasley B L, Hammond S K, O'Neill Rasor M, Schenker M B

机构信息

Maternal and Child Health Program, School of Public Health, University of California, Berkeley 94720, USA.

出版信息

Am J Ind Med. 1995 Dec;28(6):817-31. doi: 10.1002/ajim.4700280614.

DOI:10.1002/ajim.4700280614

PMID:8588566

Abstract

To investigate a possible effect of reduced fecundability (probability of conception per menstrual cycle) among women who fabricate silicon wafers, 152 fabrication-room (fab) and 251 nonfab workers were followed for an average of five menstrual cycles. Daily urine samples were analyzed to confirm clinical spontaneous abortions (SABs) and early fetal losses (EFLs). Adjusted fecundability odds ratios (FRs) for fab workers ranged from 0.59 to 0.72 (p = 0.09-0.28 vs. nonfab). For clinical pregnancies only, the adjusted FR ranged from 0.43-0.50 (p = 0.04-0.09 vs. nonfab). This lower fecundability was most pronounced among dopants and thin-film workers [adjusted FR = 0.61, 95% confidence interval (CI) = 0.27-1.40 for all pregnancies; adjusted FR = 0.22, 95% CI = 0.05-0.96 for clinical pregnancies] and in workers exposed to ethylene-based glycol ethers (adjusted FR = 0.37, 95% CI = 0.11-1.19).

摘要

为了调查制造硅片的女性生育力降低（每个月经周期受孕概率）的潜在影响，对152名制造车间（fab）工人和251名非制造车间工人进行了平均五个月经周期的跟踪。分析每日尿液样本以确认临床自然流产（SABs）和早期胎儿丢失（EFLs）。fab工人的调整后生育力优势比（FRs）范围为0.59至0.72（与非fab工人相比，p = 0.09 - 0.28）。仅对于临床妊娠，调整后的FR范围为0.43 - 0.50（与非fab工人相比，p = 0.04 - 0.09）。这种较低的生育力在掺杂剂和薄膜工人中最为明显[所有妊娠的调整后FR = 0.61，95%置信区间（CI）= 0.27 - 1.40；临床妊娠的调整后FR = 0.22，95%CI = 0.05 - 0.96]以及接触乙二醇醚的工人中（调整后FR = 0.37，95%CI = 0.11 - 1.19）。