Biophotonics Imaging Laboratory, Beckman Institute for Advanced Science and Technology, Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, 405 North Mathews Avenue, Urbana, Illinois 61801, USA.
Opt Lett. 2010 Sep 15;35(18):3120-2. doi: 10.1364/OL.35.003120.
We present a method for correcting coherence gate curvature caused by scanning-induced path length variations in spectral-domain high-NA optical coherence imaging systems. These variations cause curvature artifacts in optical coherence tomography and effectively restrict the field of view in optical coherence microscopy (OCM). Here we show that the coherence gate curvature can be measured and corrected by recovering the phase of the analytic signal from a calibration image. This phase information can be used directly to process OCM images allowing the coherence gate curvature, as well as any order of system dispersion, to be corrected in a computationally efficient manner. We also discuss the use of various image quality metrics that can be used to adjust the calibrated phase in order to keep the coherence and confocal gates aligned in tissue.
我们提出了一种方法，用于校正光谱域高数值孔径光学相干成像系统中扫描引起的路径长度变化引起的相干门曲率。这些变化会在光学相干断层扫描中产生曲率伪影，并有效地限制光学相干显微镜（OCM）的视场。在这里，我们通过从校准图像中恢复解析信号的相位来显示可以测量和校正相干门曲率。可以直接使用此相位信息来处理 OCM 图像，从而以计算效率的方式校正相干门曲率以及系统色散的任何阶。我们还讨论了使用各种图像质量指标来调整校准相位的用途，以保持在组织中相干和共焦门对准。
