Cultrera Alessandro, Serazio Danilo, Zurutuza Amaia, Centeno Alba, Txoperena Oihana, Etayo David, Cordon Alvaro, Redo-Sanchez Albert, Arnedo Israel, Ortolano Massimo, Callegaro Luca
INRIM - Istituto Nazionale di Ricerca Metrologica, Torino, 10135, Italy.
Graphenea, San Sebastián, 20009, Spain.
Sci Rep. 2019 Jul 23;9(1):10655. doi: 10.1038/s41598-019-46713-8.
Electronic applications of large-area graphene films require rapid and accurate methods to map their electrical properties. Here we present the first electrical resistance tomography (ERT) measurements on large-area graphene samples, obtained with a dedicated measurement setup and reconstruction software. The outcome of an ERT measurement is a map of the graphene electrical conductivity. The same setup allows to perform van der Pauw (vdP) measurements of the average conductivity. We characterised the electrical conductivity of chemical-vapour deposited graphene samples by performing ERT, vdP and scanning terahertz time-domain spectroscopy (TDS), the last one by means of a commercial instrument. The measurement results are compared and discussed, showing the potential of ERT as an accurate and reliable technique for the electrical characterization of graphene samples.
大面积石墨烯薄膜的电子应用需要快速且准确的方法来绘制其电学特性。在此，我们展示了首次对大面积石墨烯样品进行的电阻层析成像（ERT）测量，该测量通过专用的测量装置和重建软件获得。ERT测量的结果是石墨烯电导率的图谱。同一装置还可用于进行平均电导率的范德堡（vdP）测量。我们通过进行ERT、vdP测量以及扫描太赫兹时域光谱（TDS）（最后一项借助商用仪器进行）来表征化学气相沉积石墨烯样品的电导率。对测量结果进行了比较和讨论，展示了ERT作为一种用于石墨烯样品电学表征的准确且可靠技术的潜力。
