Kho Aaron M, Zhang Tingwei, Zhu Jun, Merkle Conrad W, Srinivasan Vivek J
Department of Biomedical Engineering, University of California Davis, Davis, CA 95616 USA.
Department of Ophthalmology and Vision Science, University of California Davis School of Medicine, Sacramento, CA 95817 USA.
Light Sci Appl. 2020 Oct 6;9:172. doi: 10.1038/s41377-020-00404-6. eCollection 2020.
Across optics and photonics, excess intensity noise is often considered a liability. Here, we show that excess noise in broadband supercontinuum and superluminescent diode light sources encodes each spectral channel with unique intensity fluctuations, which actually serve a useful purpose. Specifically, we report that excess noise correlations can both characterize the spectral resolution of spectrometers and enable cross-calibration of their wavelengths across a broad bandwidth. Relative to previous methods that use broadband interferometry and narrow linewidth lasers to characterize and calibrate spectrometers, our approach is simple, comprehensive, and rapid enough to be deployed during spectrometer alignment. First, we employ this approach to aid alignment and reduce the depth-dependent degradation of the sensitivity and axial resolution in a spectrometer-based optical coherence tomography (OCT) system, revealing a new outer retinal band. Second, we achieve a pixel-to-pixel correspondence between two otherwise disparate spectrometers, enabling a robust comparison of their respective measurements. Thus, excess intensity noise has useful applications in optics and photonics.
在光学和光子学领域,过量的强度噪声通常被视为一种负担。在此,我们表明宽带超连续谱和超发光二极管光源中的过量噪声会为每个光谱通道编码独特的强度波动,而这些波动实际上有其有用之处。具体而言,我们报告了过量噪声相关性既能表征光谱仪的光谱分辨率,又能在宽频带内实现其波长的交叉校准。相对于以往使用宽带干涉测量法和窄线宽激光器来表征和校准光谱仪的方法,我们的方法简单、全面且速度足够快,能够在光谱仪校准过程中得以应用。首先,我们采用这种方法来辅助校准,并减少基于光谱仪的光学相干断层扫描(OCT)系统中灵敏度和轴向分辨率与深度相关的退化,从而揭示了一个新的视网膜外层带。其次,我们在两个原本不同的光谱仪之间实现了像素到像素的对应关系,从而能够对它们各自的测量结果进行可靠比较。因此,过量的强度噪声在光学和光子学中具有有用的应用。