Jiang Jinbao, Doan Manh-Ha, Sun Linfeng, Kim Hyun, Yu Hua, Joo Min-Kyu, Park Sang Hyun, Yang Heejun, Duong Dinh Loc, Lee Young Hee
Center for Integrated Nanostructure Physics (CINAP) Institute for Basic Science (IBS) Suwon 16419 Republic of Korea.
Department of Energy Science Sungkyunkwan University Suwon 16419 Republic of Korea.
Adv Sci (Weinh). 2019 Dec 23;7(4):1902964. doi: 10.1002/advs.201902964. eCollection 2020 Feb.
Atomically thin 2D van der Waals semiconductors are promising candidates for next-generation nanoscale field-effect transistors (FETs). Although large-area 2D van der Waals materials have been successfully synthesized, such nanometer-length-scale devices have not been well demonstrated in 2D van der Waals semiconductors. Here, controllable nanometer-scale transistors with a channel length of ≈10 nm are fabricated via vertical channels by squeezing an ultrathin insulating spacer between the out-of-plane source and drain electrodes, and the feasibility of high-density and large-scale fabrication is demonstrated. A large on-current density of ≈70 µA µm nm at a source-drain voltage of 0.5 V and a high on/off ratio of ≈10-10 are obtained in ultrashort 2D vertical channel FETs with monolayer MoS synthesized through chemical vapor deposition. The work provides a promising route toward the complementary metal-oxide-semiconductor-compatible fabrication of wafer-scale 2D van der Waals transistors with high-density integration.
原子级薄的二维范德华半导体是下一代纳米级场效应晶体管(FET)的有前途的候选材料。尽管大面积的二维范德华材料已成功合成,但这种纳米长度尺度的器件在二维范德华半导体中尚未得到很好的展示。在此,通过在平面外源极和漏极电极之间挤压超薄绝缘间隔层,经由垂直通道制造出沟道长度约为10 nm的可控纳米尺度晶体管,并证明了高密度和大规模制造的可行性。在通过化学气相沉积合成的单层MoS的超短二维垂直沟道FET中,在源漏电压为0.5 V时获得了约70 µA µm nm的大导通电流密度和约10-10的高开关比。这项工作为实现具有高密度集成的晶圆级二维范德华晶体管的互补金属氧化物半导体兼容制造提供了一条有前途的途径。